• DocumentCode
    3600791
  • Title

    Design Considerations for Reconfigurable Delay Circuit to Emulate System Critical Paths

  • Author

    Xiaobin Yuan ; Owczarczyk, Pawel ; Drake, Alan J. ; Tiner, Marshall D. ; Hui, David T. ; Pennings, John P. ; Campisano, Francesco A. ; Willaman, Richard L. ; Cropp, Leana M. ; Dussault, Rudolph D.

  • Author_Institution
    IBM Syst. & Technol. Group, Poughkeepsie, NY, USA
  • Volume
    23
  • Issue
    11
  • fYear
    2015
  • Firstpage
    2714
  • Lastpage
    2718
  • Abstract
    The design, analysis, and implementation of an accurate delay circuit used to synthesize critical paths in a microprocessor system are presented. The delay circuit includes a novel 64-step programmable calibration delay line that is highly uniform across a wide range of supply voltages and a reconfigurable delay path with tunable delay sensitivity to voltage variations. The calibration delay line generates delay step in picosecond range, which is less than 1% of the clock cycle time for the microprocessor. The reconfigurable path is capable of increasing voltage sensitivity of the delay circuit by 40% and emulating the steeper frequency versus voltage slope of the microprocessor in low-voltage domain. The proposed circuit is implemented inside the critical path monitor block placed on a test microprocessor core fabricated using 22-nm silicon-on-insulator CMOS process. Measurement results from nine test cores show that the circuit tracks microprocessor timing margin change with an error less than 1.3% of the core operating frequency over a wide supply voltage range.
  • Keywords
    CMOS integrated circuits; delay circuits; delay lines; integrated circuit design; microprocessor chips; silicon-on-insulator; clock cycle time; complementary metal oxide semiconductor; critical path monitor block; microprocessor system; picosecond range; programmable calibration delay line; reconfigurable delay circuit; silicon-on-insulator CMOS process; size 22 nm; steeper frequency; system critical path emulation; tunable delay sensitivity; Calibration; Delay lines; Delays; Inverters; Microprocessors; Sensitivity; CMOS; Calibration delay; critical path monitor (CPM); maximum operating frequency $(F_{mathrm {MAX}})$; maximum operating frequency (FMAX); microprocessor core; picosecond delay; programmable; reconfigurable path; silicon-on-insulator (SOI); timing margin; voltage sensitivity; voltage sensitivity.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2364785
  • Filename
    6949671