• DocumentCode
    3600796
  • Title

    Efficient Statistical Timing Analysis Using Deterministic Cell Delay Models

  • Author

    Jae Hoon Kim ; Wook Kim ; Young Hwan Kim

  • Author_Institution
    Dept. of Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
  • Volume
    23
  • Issue
    11
  • fYear
    2015
  • Firstpage
    2709
  • Lastpage
    2713
  • Abstract
    This brief presents an efficient approach to statistical static timing analysis (STA), which estimates the system delay of statistical STA through deterministic STA. In statistical STA, the system delay is modeled as a function of random variables, so it is commonly expressed as a probability density function (pdf). Therefore, to estimate the system delay of statistical STA through deterministic STA, we must find the relationship between an arbitrary percentile point on the pdf of the system delay and the gate delays used in deterministic STA. However, there is no closed-form equation for an arbitrary percentile point on the pdf of the system delay, we derive an analytic expression for the upper bound of an arbitrary percentile point on the pdf of the system delay. This allows us to obtain the corresponding gate delays that are used to estimate the upper bound of the percentile point on the pdf of the system delay through deterministic STA. Experimental results indicate that the percentile point on the pdf of the system delay obtained with statistical STA is strictly bounded by the upper bound of the percentile point obtained with the proposed method within an average 6% difference range.
  • Keywords
    delays; digital circuits; network analysis; probability; timing; deterministic STA; deterministic cell delay models; digital circuit; gate delays; pdf; probability density function; statistical STA; statistical static timing analysis; system delay; system delay estimation; Delays; Logic gates; Space exploration; Standards; Upper bound; Very large scale integration; $y$; Deterministic static timing analysis (STA); percentile point; percentile point.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2364736
  • Filename
    6951502