Title :
Energy Optimized Subthreshold VLSI Logic Family With Unbalanced Pull-Up/Down Network and Inverse Narrow-Width Techniques
Author :
Ming-Zhong Li ; Chio-In Ieong ; Man-Kay Law ; Pui-In Mak ; Mang I Vai ; Sio-Hang Pun ; Martins, Rui P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Macau, Macau, China
Abstract :
Ultralow-energy biomedical applications have urged the development of a subthreshold VLSI logic family in standard CMOS. This brief proposes an unbalanced pull-up/down network, together with an inverse narrow-width technique, to improve the operating speed of the individual logic cell. Effective logical efforts save both power and die area in the process of device sizing and topology optimization. Three experimental 14-tap 8-bit finite impulse response filters optimized for ultralow-voltage operation were fabricated in 0.18-μm CMOS. Measurements show that the optimized 0.45 and 0.6 V libraries achieve minimum energy operations at 100 kHz, with a figure-of-merit of 0.365 (at 0.31 V) and 0.4632 (at 0.39 V), respectively. They correspond to 35.96% and 18.74% improvements, and the overall performances are well comparable with the state of the art.
Keywords :
CMOS logic circuits; FIR filters; VLSI; optimisation; 14-tap 8-bit finite impulse response filters; CMOS; device sizing; energy optimized subthreshold VLSI logic family; frequency 100 kHz; inverse narrow-width techniques; logic cell; size 0.18 mum; topology optimization; ultralow-voltage operation; unbalanced pull-down network; unbalanced pull-up network; voltage 0.31 V; voltage 0.39 V; voltage 0.45 V; voltage 0.6 V; Finite impulse response filters; Libraries; Logic gates; MOS devices; Standards; Transistors; Very large scale integration; CMOS; device sizing; electrocardiography (ECG); finite impulse response (FIR) filter; inverse narrow width (INW); logical effort; process-voltage-temperature (PVT) variations; process???voltage???temperature (PVT) variations; subthreshold standard logic library; ultralow energy; ultralow voltage; ultralow voltage.;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2015.2388783