DocumentCode :
3601233
Title :
Energy Optimized Subthreshold VLSI Logic Family With Unbalanced Pull-Up/Down Network and Inverse Narrow-Width Techniques
Author :
Ming-Zhong Li ; Chio-In Ieong ; Man-Kay Law ; Pui-In Mak ; Mang I Vai ; Sio-Hang Pun ; Martins, Rui P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Macau, Macau, China
Volume :
23
Issue :
12
fYear :
2015
Firstpage :
3119
Lastpage :
3123
Abstract :
Ultralow-energy biomedical applications have urged the development of a subthreshold VLSI logic family in standard CMOS. This brief proposes an unbalanced pull-up/down network, together with an inverse narrow-width technique, to improve the operating speed of the individual logic cell. Effective logical efforts save both power and die area in the process of device sizing and topology optimization. Three experimental 14-tap 8-bit finite impulse response filters optimized for ultralow-voltage operation were fabricated in 0.18-μm CMOS. Measurements show that the optimized 0.45 and 0.6 V libraries achieve minimum energy operations at 100 kHz, with a figure-of-merit of 0.365 (at 0.31 V) and 0.4632 (at 0.39 V), respectively. They correspond to 35.96% and 18.74% improvements, and the overall performances are well comparable with the state of the art.
Keywords :
CMOS logic circuits; FIR filters; VLSI; optimisation; 14-tap 8-bit finite impulse response filters; CMOS; device sizing; energy optimized subthreshold VLSI logic family; frequency 100 kHz; inverse narrow-width techniques; logic cell; size 0.18 mum; topology optimization; ultralow-voltage operation; unbalanced pull-down network; unbalanced pull-up network; voltage 0.31 V; voltage 0.39 V; voltage 0.45 V; voltage 0.6 V; Finite impulse response filters; Libraries; Logic gates; MOS devices; Standards; Transistors; Very large scale integration; CMOS; device sizing; electrocardiography (ECG); finite impulse response (FIR) filter; inverse narrow width (INW); logical effort; process-voltage-temperature (PVT) variations; process???voltage???temperature (PVT) variations; subthreshold standard logic library; ultralow energy; ultralow voltage; ultralow voltage.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2015.2388783
Filename :
7021888
Link To Document :
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