DocumentCode :
3601632
Title :
Fast Electron Ionization Effect in Multigap Pseudospark Discharge Under Nanosecond Pulsed Voltages
Author :
Jia Zhang ; Junping Zhao ; Qiaogen Zhang
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
Volume :
43
Issue :
11
fYear :
2015
Firstpage :
3921
Lastpage :
3924
Abstract :
In this paper, research studies on the breakdown progresses of multigap pseudospark discharge under nanosecond pulsed voltages are reported. The experimental results show great differences from dc voltages. The discharge mechanism of the pseudospark under nanosecond pulsed voltages has been successfully explained by the fast electron ionization effect. In each gap, collision ionizations caused by the fast electron start step by step, and development progresses are almost the same and approximately simultaneous until the main gap breaks down.
Keywords :
plasma collision processes; sparks; breakdown progresses; dc voltages; fast electron ionization effect; multigap pseudospark discharge; nanosecond pulsed voltages; plasma collision ionizations; Anodes; Breakdown voltage; Cathodes; Discharges (electric); Fault diagnosis; Ionization; Plasmas; Fast electron ionization; multigap pseudospark; nanosecond pulsed voltages; nanosecond pulsed voltages.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2015.2411693
Filename :
7063929
Link To Document :
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