Trace Orientation Function for Statistical Prediction of PCB Radiated Susceptibility and Emission

In this paper, trace orientation function (TOF) is proposed for statistical prediction of printed circuit board (PCB) radiated susceptibility and emission. This function relates the orientations and angle of incident electromagnetic wave to the location of a trace in wiring distribution of electronic board. For both susceptibility and emission of signal traces, TOF is a compact function that considers the location, orientations, and its probability of distribution. By using the TOF, one can estimate the radiated susceptibility and emission of a PCB for different points of view and derive a safe spatial region to increase the electromagnetic compatibility of electronic systems. In addition, the TOF helps to predict the electromagnetic compatibility of a system before the final step of its PCB implementation. To show the accuracy and effectiveness of TOF concept, the method is applied on a board and the results are compared with CST field solver simulations. The simulation result shows 8.1% error between statistical method and full-wave analysis for maximum electric far field of the board and maximum 42.4% error for average induced voltage on whole traces. Also, an analytic circuit level method is proposed for estimating the current amplitude of modeling dipoles, based on power consumption of the electronic system on PCB.