• DocumentCode
    3601964
  • Title

    Dynamic Reliability Assessment for Multi-State Systems Utilizing System-Level Inspection Data

  • Author

    Yu Liu ; Zuo, Ming J. ; Yan-Feng Li ; Hong-Zhong Huang

  • Author_Institution
    Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    64
  • Issue
    4
  • fYear
    2015
  • Firstpage
    1287
  • Lastpage
    1299
  • Abstract
    Traditional time-based reliability assessment methods evaluate the reliability of a multi-state system (MSS) from a population or a statistical perspective that the reliability of a system is computed purely based upon historical time-to-failure data collected from a large population of identical components or systems. These methods, however, fail to characterize the stochastic behaviors of a specific individual system. In this paper, by utilizing system-level observation history, a dynamic reliability assessment method for MSSs is put forth. The proposed recursive Bayesian formula is able to dynamically update the reliability function of a specific MSS over time by incorporating system-level inspection data. The dynamic reliability function, state probabilities, and remaining useful life distribution of an MSS in residual lifetime are derived for two common cases: the degradation of components follows a homogeneous continuous time Markov process, and a non-homogeneous continuous time Markov process. The effectiveness and accuracy of the proposed method are demonstrated via two numerical examples.
  • Keywords
    Bayes methods; Markov processes; failure analysis; inspection; reliability theory; remaining life assessment; MSS; dynamic reliability assessment method; dynamic reliability function; historical time-to-failure data; homogeneous continuous time Markov process; multistate systems; nonhomogeneous continuous time Markov process; recursive Bayesian formula; remaining useful life distribution; residual lifetime; state probabilities; statistical perspective; stochastic behaviors; system-level inspection data; system-level observation history; time-based reliability assessment methods; Computational modeling; Degradation; History; Inspection; Markov processes; Reliability; Dynamic reliability assessment; multi-state system; remaining useful life; system-level inspection data;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2015.2418294
  • Filename
    7091043