Immunity Measurement and Modeling of an ADC Embedded in a Microcontroller Using RFIP Technique

Author

Ayed, Ala ; Dubois, Tristan ; Levant, Jean-Luc ; Duchamp, Genevieve

Author_Institution

IMS Bordeaux Lab., Talence, France

Volume

57

Issue

5

fYear

2015

Firstpage

955

Lastpage

962

Abstract

This paper presents a comprehensive method for the integrated circuits (ICs) immunity characterization. The resistive RF injection probe (RFIP) method is used to study the immunity of an analog-to-digital converter (ADC) embedded in a microcontroller. The provided set of immunity parameters is then exploited to construct an immunity model of the ADC according to the Integrated Circuits Immunity Model-Conducted Immunity (ICIM-CI) model. Despite some limitations, measurement and modeling results show a good potential of this method for a better understanding of ICs immunity.

Keywords

analogue-digital conversion; electromagnetic compatibility; embedded systems; integrated circuit modelling; microcontrollers; ADC; ICIM-CI model; RFIP technique; analog-to-digital converter; immunity measurement; immunity parameters; integrated circuits immunity characterization; integrated circuits immunity model-conducted immunity model; microcontroller; resistive RF injection probe method; Current measurement; Immunity testing; Impedance; Integrated circuit modeling; Probes; Radio frequency; Voltage measurement; Analog-to-digital converter (ADC); Integrated Circuits Immunity Model-Conducted Immunity (ICIM-CI); RF injection probe (RFIP) technique; electromagnetic compatibility (EMC); electromagnetic interference (EMI); immunity measurement; immunity modeling;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2015.2422140

Filename

7094258