Title :
Immunity Measurement and Modeling of an ADC Embedded in a Microcontroller Using RFIP Technique
Author :
Ayed, Ala ; Dubois, Tristan ; Levant, Jean-Luc ; Duchamp, Genevieve
Author_Institution :
IMS Bordeaux Lab., Talence, France
Abstract :
This paper presents a comprehensive method for the integrated circuits (ICs) immunity characterization. The resistive RF injection probe (RFIP) method is used to study the immunity of an analog-to-digital converter (ADC) embedded in a microcontroller. The provided set of immunity parameters is then exploited to construct an immunity model of the ADC according to the Integrated Circuits Immunity Model-Conducted Immunity (ICIM-CI) model. Despite some limitations, measurement and modeling results show a good potential of this method for a better understanding of ICs immunity.
Keywords :
analogue-digital conversion; electromagnetic compatibility; embedded systems; integrated circuit modelling; microcontrollers; ADC; ICIM-CI model; RFIP technique; analog-to-digital converter; immunity measurement; immunity parameters; integrated circuits immunity characterization; integrated circuits immunity model-conducted immunity model; microcontroller; resistive RF injection probe method; Current measurement; Immunity testing; Impedance; Integrated circuit modeling; Probes; Radio frequency; Voltage measurement; Analog-to-digital converter (ADC); Integrated Circuits Immunity Model-Conducted Immunity (ICIM-CI); RF injection probe (RFIP) technique; electromagnetic compatibility (EMC); electromagnetic interference (EMI); immunity measurement; immunity modeling;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2015.2422140
