Title :
Robust Optimization of Multiple Timing Constraints
Author :
Wainberg, Michael ; Betz, Vaughn
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Abstract :
Modern field-programmable gate array (FPGA) circuit designs often contain multiple clocks and complex timing constraints, and achieving these constraints requires timing optimization at all stages of the computer-aided design (CAD) flow. To our knowledge, no prior published work has either described or quantitatively evaluated how to compute connection timing criticalities for circuits with multiple timing constraints in order to best guide CAD optimization algorithms. While single-clock techniques have a simple extension to multi-clock circuits, this formulation is not robust for circuits with multiple constraints of different magnitudes, or impossible constraints. We describe a robust method of timing optimization for circuits with multiple timing constraints, implemented in the open-source versatile place and route FPGA CAD tool. Our formulation can optimize multiple constraints well, even in the case where some constraints are impossible, and achieves over 20% greater clock speed with aggressive constraints than a straight-forward extension of single-clock work.
Keywords :
circuit optimisation; field programmable gate arrays; logic CAD; CAD flow; CAD optimization algorithm; FPGA circuit designs; clock speed; complex timing constraint; computer-aided design flow; connection timing criticality; field-programmable gate array; multiclock circuit; multiple-timing constraints; open-source versatile place; robust optimization; route FPGA CAD tool; single-clock technique; single-clock work; timing optimization; Clocks; Delays; Design automation; Field programmable gate arrays; Optimization; Robustness; Circuit optimization; field programmable gate arrays; field-programmable gate arrays (FPGAs); multi-clock circuits; timing analysis; timing constraint;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2015.2440316