• DocumentCode
    3602919
  • Title

    A Study of FMR Linewidth and Magnetic Order in Nanocrystalline ZnFe2O4 Thin Films

  • Author

    Sahu, B.N. ; Venkataramani, N. ; Prasad, Shiva ; Krishnan, R.

  • Author_Institution
    Dept. of Phys., IIT Bombay, Mumbai, India
  • Volume
    51
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Zinc ferrite films were deposited on fused quartz substrate at different substrate temperatures using a pulsed laser deposition technique. The deposited samples were ex situ annealed at different temperatures up to 650 °C in air for 2 h. It was found that the spontaneous magnetization of the films depends both on the grain size and on the substrate temperatures. The largest values of spontaneous magnetization for our sample were 3000 G at 300 K and 6600 G at 10 K, for the film deposited at substrate temperature of 450 °C. The ferromagnetic resonance linewidths of the films were found to depend both on substrate and annealing temperatures. A relatively low linewidth of 195 Oe was observed in parallel configuration for the film deposited at 250 °C and annealed at 350 °C.
  • Keywords
    annealing; ferrites; ferromagnetic resonance; grain size; magnetic thin films; nanofabrication; nanomagnetics; nanostructured materials; pulsed laser deposition; spontaneous magnetisation; zinc compounds; FMR linewidth; ZnFe2O4; air; annealing temperature; ferromagnetic resonance linewidth; fused quartz substrate; grain size; magnetic order; nanocrystalline zinc ferrite thin films; pulsed laser deposition; spontaneous magnetization; substrate temperature; temperature 10 K; temperature 250 degC; temperature 300 K; temperature 350 degC; temperature 450 degC; time 2 h; Annealing; Ferrites; Films; Grain size; Magnetic resonance; Magnetization; Substrates; Ferrite thin films; Ferromagnetic resonance; Grain size; Linewidth; ferromagnetic resonance (FMR); grain size; linewidth;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2015.2442681
  • Filename
    7120148