Title :
Pattern Dependence of TMR Sensor Noise
Author :
Venugopal, Veerakumar ; Guoguang Wu ; Stokes, Scott ; Huaqing Yin
Author_Institution :
Seagate Technol., Bloomington, MN, USA
Abstract :
Noise in tunneling magnetoresistive (TMR) read heads play an important role in magnetic recording. Extensive studies were carried out in understanding thermal magnetic noise in the TMR heads. The thermal noise is mostly attributed to the synthetic antiferromagnet in the TMR sensor. In this paper, we have studied the noise generated in the TMR sensor due to instabilities in the free layer using the magnetic field generated from the media dc-pattern of different polarities, and propose a test to study the read sensor instability caused by defects in the free layer. The influence of write noise from the written tracks created by the single-pole writer on the TMR sensor reader is also studied.
Keywords :
electric noise measurement; magnetic field measurement; magnetic recording noise; magnetic sensors; magnetoresistive devices; thermal noise; tunnelling magnetoresistance; TMR sensor noise; magnetic field generation; magnetic recording; read sensor instability; single-pole writer; synthetic antiferromagnet; thermal magnetic noise; tunneling magnetoresistive; write noise; Magnetic fields; Magnetic heads; Magnetization; Media; Noise; Tracking; Tunneling magnetoresistance; Magnetic heads; Perpendicular magnetic recording; magnetic heads; magnetic noise; magnetoresistive devices; perpendicular magnetic recording;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2015.2444277