DocumentCode
3603590
Title
Nonvolatile and Robust Design of Content Addressable Memory Cell Using Magnetic Tunnel Junction at Nanoscale Regime
Author
Dwivedi, Amit Krishna ; Islam, Aminul
Author_Institution
Dept. of Electron. & Commun. Eng., Birla Inst. of Technol. at Mesra, Ranchi, India
Volume
51
Issue
12
fYear
2015
Firstpage
1
Lastpage
13
Abstract
This paper proposes an efficient and robust design of content addressable memory (CAM) system. Design metrics, such as search time, power dissipation, power-delay product (PDP), and energy-delay product (EDP), of the proposed design are compared with those of previously reported CAM cell found in the literature. CAM cell presented in this paper offers 2.589× improvement in search time, 2.725× improvement in PDP, and 2.729× improvement in EDP for mismatch 1 at 700 mV. It exhibits 2.257× improvement in search time, 2.38× improvement in PDP, and 2.389× improvement in EDP for mismatch 0 at 700 mV. The proposed CAM cell also proves its efficiency in terms of power consumption, which is one of the most concerned design issues. It offers 1.0526× improvement in power consumption for mismatch 1 and 1.054× improvement in power consumption for mismatch 0. The proposed CAM cell is also analyzed to investigate the impact of tunneling magnetoresistance variations on power consumption, PDP, EDP, search time, and search-time variability. In addition, this paper also proposes an efficient match line sensing scheme for the proposed CAM cell.
Keywords
content-addressable storage; low-power electronics; random-access storage; tunnelling magnetoresistance; CAM system; content addressable memory cell; design metrics; energy-delay product; magnetic tunnel junction; nanoscale regime; nonvolatile design; power consumption; power dissipation; power-delay product; robust design; search time variability; tunneling magnetoresistance variations; voltage 700 mV; Computer aided manufacturing; Computer architecture; Magnetic tunneling; Microprocessors; Resistance; Switches; Tunneling magnetoresistance; CAM; Content addressable memory (CAM); energy-delay product; energy-delay product (EDP); magnetic tunnel junction (MTJ); power-delay product; power-delay product (PDP); search time; search-time; tunneling magneto-resistance (TMR); tunneling magnetoresistance (TMR);
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2015.2454477
Filename
7153542
Link To Document