• DocumentCode
    3603663
  • Title

    Digital Offset Cancellation for Long Time-Constant Subthreshold OTA-C Integrators

  • Author

    White, Daniel J. ; Hoffman, Michael W. ; Balk?„?±r, Sina

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Valparaiso Univ., Valparaiso, IN, USA
  • Volume
    62
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1038
  • Lastpage
    1042
  • Abstract
    Systems using integrators with very long time constants can place a severe constraint on allowable amplifier offset. Postfabrication cancellation of these offsets is a requirement in these applications. This brief describes the design, simulation, and measurement of a subthreshold operational transconductance amplifier (OTA) with digital calibration and its robust calibration algorithm. Statistical simulations show the scheme´s ability to reduce the output offset by a factor of 40. Measurements on many prototype OTAs validate the technique´s ability to bring the standard deviation of integrated output offset to less than 10 mV in most cases, or about 30μ V input-referred offsets. A secant-based algorithm is proposed that finds the optimum digital calibration code for each OTA in a small number of search steps that minimizes the integrated output offset. This algorithm is robust to nonmonotonic tuning characteristics, allowing the additional circuitry to be minimally sized. For low-frequency applications below 5 Hz, the scheme has nearly no net impact on die area in processes allowing circuitry below the integration capacitor.
  • Keywords
    calibration; integrated circuit design; integrated circuit manufacture; integrated circuit measurement; operational amplifiers; statistical analysis; amplifier offset; calibration algorithm; digital offset cancellation; integration capacitor; nonmonotonic tuning characteristics; operational transconductance amplifier; optimum digital calibration code; secant-based algorithm; standard deviation; statistical simulations; time-constant subthreshold OTA-C integrators; Algorithm design and analysis; Calibration; Mirrors; Prototypes; Standards; Transistors; Tuning; Analog processing circuits; Calibration algorithms; Integrator; Mixed analog digital integrated circuits; OTA; Sub-threshold; calibration algorithms; integrator; mixed analog digital integrated circuits; operational transconductance amplifier (OTA); subthreshold;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2015.2455982
  • Filename
    7155508