DocumentCode :
3603805
Title :
A Low-Leakage Body-Guarded Analog Switch in 0.35- \\mumbox{m} BiCMOS and Its Applications in Low-Speed Switched-Capacitor Circuits
Author :
Jin Jyh Su ; Demirci, Kemal S. ; Brand, Oliver
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
62
Issue :
10
fYear :
2015
Firstpage :
947
Lastpage :
951
Abstract :
A low-leakage body-guarded analog switch (BGswitch) for slow switched-capacitor (SC) circuits is presented. The improvement of accuracy in SC circuits employing BG-switches is demonstrated by comparing their performance with counterparts employing conventionally biased CMOS switches in three applications: sample-and-hold (S/H) amplifier, SC amplifier, and highvoltage drain-extended MOSFET (DEMOS). The leakage currents of BG-switch-enabled circuits are characterized across process variations and different operation voltages in all demonstrated applications. With nominal output voltages at room temperature, the average absolute leakage current of BG-switch-enabled S/H amplifier (12.02 aA), SC amplifier (54.52 aA), and DEMOS (53.71 fA) show leakage current improvement of 21, 28, and 17 dB, respectively, compared with equivalent circuits utilizing transmission gates (TGs). BG-switch-enabled S/H circuits and SC amplifiers with average performance exhibit lower leakage currents up to 100 °C compared with TG-enabled circuits. The demonstrated applications utilizing BG-switches were fabricated in a standard 0.35-μm BiCMOS process.
Keywords :
BiCMOS analogue integrated circuits; amplifiers; equivalent circuits; leakage currents; sample and hold circuits; switched capacitor networks; BiCMOS; SC amplifier; current 12.02 aA; current 53.71 fA; current 54.52 aA; drain-extended MOSFET; equivalent circuits; leakage current; low-leakage body-guarded analog switch; low-speed switched-capacitor circuits; sample-and-hold amplifier; size 0.35 mum; temperature 100 C; transmission gates; Capacitors; Current measurement; Leakage currents; MOSFET; Switches; Switching circuits; Temperature measurement; CMOS switch; Charge pump; MOSFET leakage; SC circuit; charge pump; high-voltage switch; low-leakage switch; sample-and-hold; sample-and-hold (S/H); switched-capacitor (SC) amplifier; switched-capacitor amplifier; switched-capacitor circuit;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2015.2458093
Filename :
7161295
Link To Document :
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