• DocumentCode
    3604024
  • Title

    Estimation of the Equivalent Number of Looks in SAR Images Based on Singular Value Decomposition

  • Author

    Weilong Ren ; Jianshe Song ; Song Tian ; Xiongmei Zhang

  • Author_Institution
    Xi´an High-Tech Inst., Xi´an, China
  • Volume
    12
  • Issue
    11
  • fYear
    2015
  • Firstpage
    2208
  • Lastpage
    2212
  • Abstract
    In this letter, a singular value decomposition (SVD)-based method for estimating the equivalent number of looks (ENL) in synthetic aperture radar (SAR) images is proposed. First, SAR images are logarithmically scaled to change the multiplicative speckle into additive noise. Assuming that the multiplicative speckle is a gamma random variable with unit mean, a monotone function is established between the ENL and the variance of the additive noise, thus transforming the ENL estimation problem into estimating the variance of the additive noise. Then SVD is applied to the logarithmic image in a window with certain size to obtain its singular values. By making use of an empirical linear relationship between the average of the smallest singular values and the standard deviation of the noise in the logarithmic image, the variance of the additive noise is finally estimated. Experiments of both simulated and real SAR images demonstrated the effectiveness of the proposed method.
  • Keywords
    estimation theory; radar imaging; singular value decomposition; speckle; synthetic aperture radar; ENL estimation problem; SAR images; SVD-based method; additive noise; equivalent number of looks; gamma random variable; logarithmic image; monotone function; multiplicative speckle; singular value decomposition; standard deviation; synthetic aperture radar; Additive noise; Estimation; Singular value decomposition; Speckle; Standards; Synthetic aperture radar; Equivalent number of looks (ENL); singular value decomposition (SVD); synthetic aperture radar (SAR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2015.2457334
  • Filename
    7169521