Title :
Using Termination Effect to Characterize Electric and Magnetic Field Coupling Between TEM Cell and Microstrip Line
Author :
Chunlei Shi ; Wenxiao Fang ; Changchun Chai ; Yun Huang ; Yunfei En ; Yintang Yang ; Yuan Liu ; Yiqiang Chen ; Xueyang Liao
Author_Institution :
Sch. of Microelectron., Xidian Univ., Xi´an, China
Abstract :
In this paper, we change terminal loads of a microstrip line to separate electric field coupling and magnetic field coupling between a microstrip line and a transverse electromagnetic (TEM) cell during radiated emission measurement. Such separation can also be validated by another terminal load. After validation, the effect of termination on both couplings is investigated, and the requirements of termination impedance to suppress the two couplings are revealed. In addition, we find that the linear physical models deriving both lumped coupling parameters only hold below a limited frequency.
Keywords :
TEM cells; electric fields; magnetic fields; microstrip lines; TEM cell; electric field coupling; linear physical models; magnetic field coupling; microstrip line; radiated emission measurement; termination effect; transverse electromagnetic cell; Capacitance; Couplings; Impedance; Integrated circuit modeling; Magnetic separation; Microstrip; TEM cells; Coupling model; microstrip line; radiated emission; termination effect; transverse electromagnetic (TEM) cell;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2015.2459063
