DocumentCode
3604209
Title
Thermal Aging Performance Analyses of High Color Rendering Index of Glass-Based Phosphor-Converted White-Light-Emitting Diode
Author
Chun-Chin Tsai
Author_Institution
Dept. of Optoelectron. Eng., Far East Univ., Tainan, Taiwan
Volume
15
Issue
4
fYear
2015
Firstpage
617
Lastpage
620
Abstract
This paper reported the high-temperature performances of glass-based phosphor-converted warm-white light-emitting diodes (PC-WWLEDs). The fabrication and characteristics of low-temperature phosphor (Yellow:Ce:3+:YAG, Greed:Tb3+:YAG, Red:CaAlClSiN3:Eu2+) doped glass were presented for high color rendering indexes warm-white-light-emitting diodes. As demonstrated, the PC-WLEDs maintained good thermal stability at the high temperature operation; the characterization results of color coordinates (x, y) = (0.32, 0.28) is as follows: quantum yield (QY) = 55%, color rending index (CRI) = 85, and correlated color temperature (CCT) = 3900 K. The results showed that the PC-WLEDs maintained good thermal stability at the high temperature operation. The QY decay, CRI attenuation and chromaticity shift in glass-based high-power PC-WLEDs were also compared with those of silicone-based counterparts thermally aged at 150 °C and 250 °C. These results indicated that the glass-based PC-WLEDs exhibited better thermal stability than the silicone. The color rendering indexes (CRIs) of glass phosphor hopefully have potential used as a phosphor layer for high-performance and low-cost PC-WLEDs for the next-generation indoor solid-state lighting applications.
Keywords
ageing; glass; light emitting diodes; lighting; phosphors; thermal stability; CCT; CRI attenuation; PC-WWLED; chromaticity shift; correlated color temperature; glass-based phosphor-converted white-light-emitting diode; high color rendering index; low-temperature phosphor doped glass; next-generation indoor solid-state lighting application; temperature 150 C; temperature 250 C; thermal aging performance analysis; thermal stability; Aging; Attenuation; Color; Glass; Light emitting diodes; Phosphors; Thermal stability; Aging test; CRI; color rending index; high-power LED modules; phosphor layer;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2015.2464375
Filename
7177071
Link To Document