• DocumentCode
    3604222
  • Title

    Effects of Thickness Ratio of Co to Pt Layer on Magnetic Properties and Microstructure of [Co/Pt]n Multilayer Films

  • Author

    Tsu-Ching Yang ; Yu-Shen Chen ; Yin-Cheng Ju ; Yu-Ting Lin ; Chuan-Fa Huang ; Hsi-Chuan Lu ; Sea-Fue Wang ; Sharma, Puneet ; An-Cheng Sun

  • Author_Institution
    Dept. of Chem. Eng. & Mater. Sci., Yuan Ze Univ., Zhongli, Taiwan
  • Volume
    51
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    [Co/Pt]n multilayer films were deposited on a glass substrate with a Pt underlayer by an alternative sputtering method. The effect of overall multilayer [CoPt]n thickness and the relative thickness of Co to Pt layers on the structural and magnetic properties were investigated. First, the thickness ratio of Co to Pt layers (Co:Pt = 4:3, 1:1, and 3:4) in [Co/Pt]n multilayer films was varied. Higher coercivity and out-of-plane squareness were found for the [Co1 nm/Pt0.75 nm]n and [Co1 nm/Pt1 nm]n multilayer films. The total thickness of multilayers was varied from 3.5 to 8 nm. When the Co to Pt layers thickness ratio was changed to 3:4, the magnetic performance was declined. Furthermore, the thickness ratio of Co to Pt layers was kept constant to 1:1, and the Co and Pt layer thickness in [Cox nm/Ptx nm]n film was varied. The highest coercivity of 2.1 kOe was obtained in the [Co0.5/Pt0.5]4 film. The magnetic properties were decreased with further increase in the Co and Pt layer thickness. In this paper, we demonstrated that [Co/Pt]n multilayer films with the suitable thickness ratio of Co to Pt layers are beneficial to prepare CoPt thin films with perpendicular magnetic anisotropy.
  • Keywords
    cobalt; coercive force; crystal microstructure; magnetic multilayers; magnetic thin films; platinum; Co-Pt; SiO2; alternative sputtering method; coercivity; glass substrate; magnetic properties; microstructures; multilayer film deposition; multilayer films; multilayer thickness; perpendicular magnetic anisotropy; structural properties; Atomic layer deposition; Films; Magnetic multilayers; Magnetic properties; Magnetic recording; Nonhomogeneous media; Perpendicular magnetic anisotropy; CoPt thin films; Magnetic recording media; magnetic properties; magnetic recording media; multilayer;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2015.2464321
  • Filename
    7177109