DocumentCode :
3604364
Title :
Silicon-Air-Silicon Distributed Bragg Reflectors for Visible and Near Infrared Optical MEMS
Author :
Tripathi, Dhirendra Kumar ; Dilusha Silva, K.K.M.B. ; Bumgarner, John W. ; Rafiei, Ramin ; Martyniuk, Mariusz ; Dell, John M. ; Faraone, Lorenzo
Author_Institution :
Sch. of Electr., Electron. & Comput. Eng., Univ. of Western Australia, Perth, WA, Australia
Volume :
24
Issue :
5
fYear :
2015
Firstpage :
1245
Lastpage :
1247
Abstract :
This letter presents the design, fabrication, and optical characterization of silicon-air-silicon-based surface micro-machined distributed Bragg reflectors (DBRs) for the visible to near infrared wavelength range (540-960 nm). The DBR (mirror) consisted of two quarter wave thick silicon films separated by a quarter-wave air gap. A mirror array was successfully fabricated, consisting of mirrors ranging in diameter between 270 and 420 μm. Calibrated optical measurements indicate that a peak reflectivity close to 92% has been achieved for visible wavelengths, despite the fact that silicon has strong absorbtion in the visible wavelength range. The mirrors are shown to be broadband reflectors, having 85% or more reflectivity over a 160-nm wavelength range. A spatially resolved optical transmission mapping and optical transmission profile of the mirrors demonstrates high uniformity across the fabricated array of DBRs.
Keywords :
distributed Bragg reflectors; elemental semiconductors; infrared spectra; light transmission; micromachining; micromechanical devices; optical variables measurement; silicon; visible spectra; DBR mirror; Si; broadband reflectors; calibrated optical measurements; mirror array; near infrared optical MEMS; optical characterization; optical transmission profile; quarter wave air gap; quarter wave thick silicon films; silicon-air-silicon; size 270 mum to 420 mum; spatially resolved optical transmission mapping; surface micromachined distributed Bragg reflectors; visible optical MEMS; wavelength 540 nm to 960 nm; Integrated optics; Mirrors; Optical device fabrication; Optical imaging; Optical variables measurement; Silicon; Wavelength measurement; Distributed Bragg reflector; Fabry-Pérot filter; Fabry-P??rot filter; near infrared wavelength; optical microelectromechanical systems (MEMS); optical microelectromechanical systems (MEMS).; visible wavelength;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2015.2459076
Filename :
7182742
Link To Document :
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