• DocumentCode
    3604364
  • Title

    Silicon-Air-Silicon Distributed Bragg Reflectors for Visible and Near Infrared Optical MEMS

  • Author

    Tripathi, Dhirendra Kumar ; Dilusha Silva, K.K.M.B. ; Bumgarner, John W. ; Rafiei, Ramin ; Martyniuk, Mariusz ; Dell, John M. ; Faraone, Lorenzo

  • Author_Institution
    Sch. of Electr., Electron. & Comput. Eng., Univ. of Western Australia, Perth, WA, Australia
  • Volume
    24
  • Issue
    5
  • fYear
    2015
  • Firstpage
    1245
  • Lastpage
    1247
  • Abstract
    This letter presents the design, fabrication, and optical characterization of silicon-air-silicon-based surface micro-machined distributed Bragg reflectors (DBRs) for the visible to near infrared wavelength range (540-960 nm). The DBR (mirror) consisted of two quarter wave thick silicon films separated by a quarter-wave air gap. A mirror array was successfully fabricated, consisting of mirrors ranging in diameter between 270 and 420 μm. Calibrated optical measurements indicate that a peak reflectivity close to 92% has been achieved for visible wavelengths, despite the fact that silicon has strong absorbtion in the visible wavelength range. The mirrors are shown to be broadband reflectors, having 85% or more reflectivity over a 160-nm wavelength range. A spatially resolved optical transmission mapping and optical transmission profile of the mirrors demonstrates high uniformity across the fabricated array of DBRs.
  • Keywords
    distributed Bragg reflectors; elemental semiconductors; infrared spectra; light transmission; micromachining; micromechanical devices; optical variables measurement; silicon; visible spectra; DBR mirror; Si; broadband reflectors; calibrated optical measurements; mirror array; near infrared optical MEMS; optical characterization; optical transmission profile; quarter wave air gap; quarter wave thick silicon films; silicon-air-silicon; size 270 mum to 420 mum; spatially resolved optical transmission mapping; surface micromachined distributed Bragg reflectors; visible optical MEMS; wavelength 540 nm to 960 nm; Integrated optics; Mirrors; Optical device fabrication; Optical imaging; Optical variables measurement; Silicon; Wavelength measurement; Distributed Bragg reflector; Fabry-Pérot filter; Fabry-P??rot filter; near infrared wavelength; optical microelectromechanical systems (MEMS); optical microelectromechanical systems (MEMS).; visible wavelength;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2015.2459076
  • Filename
    7182742