• DocumentCode
    3604443
  • Title

    RF Transconductor Linearization Robust to Process, Voltage and Temperature Variations

  • Author

    Kundur Subramaniyan, Harish ; Klumperink, Eric A. M. ; Srinivasan, Venkatesh ; Kiaei, Ali ; Nauta, Bram

  • Author_Institution
    IC-Design Group, Univ. of Twente, Enschede, Netherlands
  • Volume
    50
  • Issue
    11
  • fYear
    2015
  • Firstpage
    2591
  • Lastpage
    2602
  • Abstract
    Software-defined radio receivers increasingly exploit linear RF V-I conversion, instead of RF voltage gain, to improve interference robustness. Unfortunately, the linearity of CMOS inverters, which are often used to implement V-I conversion, is highly sensitive to Process, Voltage and Temperature variations. This paper proposes a more robust technique based on resistive degeneration. To mitigate third-order IM3 distortion induced by the quadratic MOSFET I-V characteristic, a new linearization technique is proposed which exploits a floating battery by-pass circuit and replica biasing to improve IIP3 in a robust way. This paper explains the concept and analyzes linearity improvement. To demonstrate operation, an LNTA with current domain mixer is implemented in a 45 nm CMOS process. Compared to a conventional inverter based LNTA with the same transconductance, it improves IIP3 from 2 dBm to a robust P IIP3 of 8 dBm at the cost of 67% increase in power consumption.
  • Keywords
    CMOS integrated circuits; MOSFET; invertors; linearisation techniques; operational amplifiers; radio receivers; radiofrequency amplifiers; software radio; CMOS inverters; LNTA; RF V-I conversion; RF transconductor linearization; RF voltage gain; floating battery; linearization technique; quadratic MOSFET; resistive degeneration; size 45 nm; software defined radio receivers; third-order IM3 distortion; Batteries; CMOS integrated circuits; Distortion; Inverters; Linearity; MOSFET; Receivers; CMOS; IIP3; SAW-less receiver; cognitive radio receiver; figure-of-merit; linearity; linearization; multi-band receiver; negative feedback; process voltage temperature (PVT) variations; receiver; reconfigurable receiver; robust circuit design; software-defined radio; software-defined receiver; transconductor; wideband receiver;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2015.2453964
  • Filename
    7185467