• DocumentCode
    3604531
  • Title

    Energy-Efficient Nonvolatile Flip-Flop With Subnanosecond Data Backup Time for Fine-Grain Power Gating

  • Author

    Kazemi, Mohammad ; Ipek, Engin ; Friedman, Eby G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
  • Volume
    62
  • Issue
    12
  • fYear
    2015
  • Firstpage
    1154
  • Lastpage
    1158
  • Abstract
    A nonvolatile flip-flop (NVFF) is proposed, where magnetic tunnel junctions (MTJs) are incorporated into a CMOS flip-flop (FF) to enable nonvolatility. The voltage-controlled magnetic anisotropy (VCMA) effect is utilized to back up the latched data into MTJs before the power supply is turned off. Switching an MTJ through the VCMA effect does not require a dedicated write circuit for data backup, resulting in reduced area as compared with NVFFs exploiting the spin transfer torque (STT) switching mechanism. In a VCMA-based NVFF, the MTJs are coherently switched, enabling ultra-energy efficient data backup with subnanosecond backup time. Simulation results exhibit more than a 342× (33.7×) improvement in data backup energy per bit, and more than 35.5× (7.7×) improvement in data backup delay per bit as compared with the most efficient STT-based NVFFs (spin Hall effect-based NVFF). The energy efficiency of the VCMA-based NVFF results in sufficiently short breakeven times, enabling effective fine-grain power gating.
  • Keywords
    CMOS integrated circuits; flip-flops; magnetic anisotropy; magnetic tunnelling; CMOS flip-flop; STT; VCMA effect; energy-efficient nonvolatile flip-flop; fine-grain power gating; latched data; magnetic tunnel junctions; power supply; spin transfer torque; subnanosecond data backup time; ultraenergy efficient data backup; voltage-controlled magnetic anisotropy; Circuits and systems; Delays; Magnetic tunneling; Magnetization; Perpendicular magnetic anisotropy; Switches; Breakeven time (BET); Magnetic tunnel junction (MTJ); break even time (BET); fine grain power gating; fine-grain power gating; magnetic tunnel junction (MTJ); nonvolatile flip flop (NVFF); nonvolatile flip-flop (NVFF); voltage controlled magnetic anisotropy (VCMA); voltage-controlled magnetic anisotropy (VCMA);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2015.2468931
  • Filename
    7202809