• DocumentCode
    3604543
  • Title

    Estimation Method for Statistical Eye Diagram in a Nonlinear Digital Channel

  • Author

    Chiu-Chih Chou ; Sheng-Yun Hsu ; Tzong-Lin Wu

  • Author_Institution
    Electr. Eng. Dept., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    57
  • Issue
    6
  • fYear
    2015
  • Firstpage
    1655
  • Lastpage
    1664
  • Abstract
    An estimation method for statistical eye diagram in a digital channel with nonlinear circuitry is proposed, which is based on the superposition of multiple bit pattern responses method. The proposed method captures the nonlinear effects in the channel by using 2m bit pattern responses as bases for doing superposition. By selecting a larger m, the nonlinear performance of the channel can be captured more accurately. Besides the statistical eye diagram, a corresponding bathtub curve computing method is also proposed, which not only gives the total bit error rate (BER) distribution, but also the BER when transmitting a logic “1” signal and the BER of transmitting “0.” The proposed method is verified using two different channel topologies: the push-pull output driver and the open-drain output driver. The predicted results are in agreement with the result of PRBS, while the CPU time of this method is much less than PRBS.
  • Keywords
    error statistics; estimation theory; random sequences; signal processing; BER; PRBS; bathtub curve computing; bit error rate; channel topology; estimation method; logic signal; multiple bit pattern responses method; nonlinear circuitry; nonlinear digital channel; nonlinear effects; open-drain output driver; pseudorandom bit sequence; push-pull output driver; statistical eye diagram; Bit error rate; Channel estimation; Convolution; Estimation; Jitter; Probability; Probability density function; Bit error rate (BER); channel evaluation; eye diagram prediction; nonlinear driver; probability density function; signal integrity;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2015.2457928
  • Filename
    7202856