• DocumentCode
    3604790
  • Title

    Wafer-Level Hermetic All-Glass Packaging for Microalkali Vapor Cells of Chip-Scale Atomic Devices

  • Author

    Yu Ji ; Qi Gan ; Lei Wu ; Jintang Shang ; Ching-ping Wong

  • Author_Institution
    Key Lab. of MEMS, Southeast Univ., Nanjing, China
  • Volume
    5
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1551
  • Lastpage
    1558
  • Abstract
    To maintain a controllable environment for microalkali vapor cells of high-performance chip-scale atomic devices, a novel wafer-level hermetic all-glass packaging technology for microalkali vapor cells of atomic devices was investigated. A glass wafer with metal vias was used as the substrate to host the miroalkali vapor cells. Wafer-level hemispherical glass bubbles prepared by a chemical foaming process were used as transparent packaging caps. The performance of the rubidium vapor cell in the all-glass hermetic package was characterized by a laser frequency locking system and an ultraviolet spectrophotometer. The results show that hermetic all-glass packaging at a wafer level was demonstrated successfully. The results also indicate that after the hermetic all-glass packaging, the temperature variation of the microalkali vapor cells was controllably below 0.2°C at different working temperatures of atomic devices. A chip-scale atomic magnetometer using the hermetic all-glass micro vapor cell was demonstrated eventually.
  • Keywords
    bubbles; chip scale packaging; foams; magnetometers; rubidium; spectrophotometers; wafer level packaging; Rb; chemical foaming; chip-scale atomic magnetometer; controllable environment; glass wafer; hermetic all-glass microvapor cell; high-performance chip-scale atomic devices; laser frequency locking system; metal vias; microalkali vapor cells; rubidium vapor cell; transparent packaging caps; ultraviolet spectrophotometer; wafer-level hemispherical glass bubbles; wafer-level hermetic all-glass packaging; Atom optics; Atomic clocks; Atomic measurements; Glass; Packaging; Substrates; Atomic devices; chemical foaming process (CFP); hot forming process; microrubidium vapor cell; optically pumped atomic magnetometer; ultraviolet spectrophotometer; wafer-level hermetic package; wafer-level hermetic package.;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2015.2462748
  • Filename
    7214238