DocumentCode
3604895
Title
An Improved Small-Signal Model for SiGe HBT Under OFF-State, Derived From Distributed Network and Corresponding Model Parameter Extraction
Author
Yabin Sun ; Jun Fu ; Ji Yang ; Jun Xu ; Yudong Wang ; Jie Cui ; Wei Zhou ; Zhang Wei ; Zhihong Liu
Author_Institution
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
Volume
63
Issue
10
fYear
2015
Firstpage
3131
Lastpage
3141
Abstract
An improved high-frequency small-signal model for SiGe HBTs under the off-state is presented in this paper. The proposed model takes into account the distribution characteristics of the intrinsic transistor, link base region under spacer, and extrinsic base-collector junction. The equivalent circuit for each region is separately derived using the transmission line equation with reasonable approximations. Being different from previous models, the intrinsic base resistance in the proposed model is pushed inside the internal base node and added to the components of collector and emitter resistance. To extract all the parameters for the proposed model, a novel extraction technique based on rational function fitting over the whole range of frequencies is developed. After the rational function fitting to related admittance parameters, a number of coefficients are accurately obtained and then all the model parameters are directly extracted without any special test structure or numerical optimization. The proposed model and extraction technique are validated with a series of sized SiGe HBTs from 100 MHz to 20.89 GHz at a wide range of bias points. An excellent agreement is obtained between the measured and simulated S-parameters.
Keywords
Ge-Si alloys; S-parameters; equivalent circuits; heterojunction bipolar transistors; semiconductor device models; transmission lines; SiGe; SiGe HBT; collector resistance; distributed network; emitter resistance; equivalent circuit; extraction technique; extrinsic base-collector junction; frequency 100 MHz to 20.89 GHz; high-frequency small-signal model; intrinsic base resistance; intrinsic transistor; link base region; model parameter extraction; rational function fitting; simulated S-parameters; transmission line equation; Capacitance; Equivalent circuits; Integrated circuit modeling; Mathematical model; Resistance; Silicon germanium; Transistors; Distributed network; SiGe HBTs; parameter extraction; rational function fitting; small-signal model;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2015.2468211
Filename
7219472
Link To Document