DocumentCode :
3604947
Title :
A Monolithic Capacitor-Current-Controlled Hysteretic Buck Converter With Transient-Optimized Feedback Circuit
Author :
Shih-Hsiung Chien ; Ting-Hsuan Hung ; Szu-Yu Huang ; Tai-Haur Kuo
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
50
Issue :
11
fYear :
2015
Firstpage :
2524
Lastpage :
2532
Abstract :
This paper proposes a monolithic capacitor-current-controlled hysteretic buck converter with a transient-optimized feedback circuit (TOFC) for compact-sized portable devices. The proposed TOFC simultaneously optimizes both load and dynamic voltage scaling (DVS) transient responses to minimize output voltage undershoot/overshoot and settling time. In addition, a transient-hold (TH) technique, which prevents transient response optimization from being affected by the error amplifier without increasing the compensation capacitance, is also proposed to save chip area. This work is implemented in a 0.35 μm CMOS process with a chip area of 0.88 mm 2 . Measurement results show that, for a 500 mA load transient, the output voltage settles in 0.9 μs with an undershoot/overshoot of less than 35 mV. For a 0.6-V DVS transient, output voltage settles in 3 μs with negligible undershoot/overshoot. Moreover, 96% peak efficiency is measured at 500 mW output power.
Keywords :
CMOS integrated circuits; DC-DC power convertors; amplifiers; capacitors; circuit feedback; electric current control; transient response; CMOS process; DVS transient; compact-sized portable devices; compensation capacitance; current 500 mA; current controlled hysteretic buck converter; dynamic voltage scaling; error amplifier; load voltage scaling; monolithic capacitor; power 500 mW; size 0.35 mum; transient optimized feedback circuit; transient response; transient-hold technique; voltage 0.6 V; Capacitors; Feedback circuits; Inductors; Optimization; Transient analysis; Transient response; Voltage control; Capacitor-current sensor; DC-DC buck converter; dynamic voltage scaling; fast transient response; load transient;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2015.2464720
Filename :
7222481
Link To Document :
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