• DocumentCode
    3605177
  • Title

    0.34 text{V}_{math\\rm {T}} AlGaN/GaN-on-Si Large Schottky Barrier Diode With Recessed Dual Anode Metal

  • Author

    Hyun-Soo Lee ; Dong Yun Jung ; Youngrak Park ; Jeho Na ; Hyun-Gyu Jang ; Hyoung-Seok Lee ; Chi-Hoon Jun ; Junbo Park ; Sang-Ouk Ryu ; Sang Choon Ko ; Eun Soo Nam

  • Author_Institution
    Electron. & Telecommun. Res. Inst., Daejeon, South Korea
  • Volume
    36
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1132
  • Lastpage
    1134
  • Abstract
    A large GaN-Schottky barrier diode (SBD) with a recessed dual anode metal is proposed to achieve improved the forward characteristics without a degradation of the reverse performances. Using optimized dry etch condition for a large device, the electrical characteristics of the device are demonstrated when applying the recessed dual anode metal and changing the recess depths. The device size and channel width are 4 mm2 and 63 mm, respectively. The 16-nm recessed dual anode metal SBD has a turn-ON voltage of 0.34 V, a breakdown voltage of 802 V, and a reverse leakage current of 1.82 μA/mm at -15 V. The packaged SBD exhibits a forward current of 6.2 A at 2 V and a reverse recovery charge of 11.54 nC.
  • Keywords
    III-V semiconductors; Schottky diodes; aluminium compounds; gallium compounds; leakage currents; silicon; wide band gap semiconductors; AlGaN; GaN; SBD; Schottky barrier diode; Si; breakdown voltage; current 6.2 A; dry etch condition; forward current; recessed dual anode metal; reverse leakage current; voltage 0.34 V; voltage 2 V; voltage 802 V; Aluminum gallium nitride; Anodes; Gallium nitride; Schottky barriers; Schottky diodes; Wide band gap semiconductors; AlGaN/GaN on Si; Schottky barrier diode (SBD); low turn-on voltage; recess dual anode metal;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2475178
  • Filename
    7230252