DocumentCode :
3605254
Title :
Terahertz Conductivity of Copper Surfaces
Author :
Kirley, M.P. ; Booske, John H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
Volume :
5
Issue :
6
fYear :
2015
Firstpage :
1012
Lastpage :
1020
Abstract :
Terahertz (THz) radiation holds great promise for applications in communications, molecular detection, and imaging. Effective THz system design requires accurate models for the frequency-dependent conductivity of metals and the effect of surface roughness on conduction loss. However, predictive methods are currently unverified in the region between 0.3 and 0.9 THz because few experimental data exist in this regime. In order to address this problem, we have measured the conductivity of copper, of various surface roughnesses, using a semi-confocal open resonator system. This paper describes our measurements of the THz conductivity, dc conductivity, roughness, and microstructure of copper. We show that the classical Drude theory is sufficient for predicting the THz conductivity of copper at room temperature and that dissipation loss enhancement caused by surface roughness is modeled better by the Hammerstad-Bekkadal formula than second-order small perturbation theory.
Keywords :
copper; electrical conductivity; perturbation theory; surface conductivity; surface roughness; terahertz waves; Cu; Hammerstad-Bekkadal formula; THz conductivity; THz system design; classical Drude theory; conduction loss; copper surface; dc conductivity; dissipation loss enhancement; frequency-dependent conductivity; microstructure; molecular detection; molecular imaging; second-order small perturbation theory; semi-confocal open resonator system; surface roughness; temperature 293 K to 298 K; terahertz conductivity; terahertz radiation; Conductivity; Copper; Optical surface waves; Rough surfaces; Surface roughness; Surface topography; Surface waves; Conductivity measurements; electromagnetic (EM) materials characterization; rough surfaces; terahertz (THz) measurements;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2015.2468074
Filename :
7234948
Link To Document :
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