• DocumentCode
    3605254
  • Title

    Terahertz Conductivity of Copper Surfaces

  • Author

    Kirley, M.P. ; Booske, John H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
  • Volume
    5
  • Issue
    6
  • fYear
    2015
  • Firstpage
    1012
  • Lastpage
    1020
  • Abstract
    Terahertz (THz) radiation holds great promise for applications in communications, molecular detection, and imaging. Effective THz system design requires accurate models for the frequency-dependent conductivity of metals and the effect of surface roughness on conduction loss. However, predictive methods are currently unverified in the region between 0.3 and 0.9 THz because few experimental data exist in this regime. In order to address this problem, we have measured the conductivity of copper, of various surface roughnesses, using a semi-confocal open resonator system. This paper describes our measurements of the THz conductivity, dc conductivity, roughness, and microstructure of copper. We show that the classical Drude theory is sufficient for predicting the THz conductivity of copper at room temperature and that dissipation loss enhancement caused by surface roughness is modeled better by the Hammerstad-Bekkadal formula than second-order small perturbation theory.
  • Keywords
    copper; electrical conductivity; perturbation theory; surface conductivity; surface roughness; terahertz waves; Cu; Hammerstad-Bekkadal formula; THz conductivity; THz system design; classical Drude theory; conduction loss; copper surface; dc conductivity; dissipation loss enhancement; frequency-dependent conductivity; microstructure; molecular detection; molecular imaging; second-order small perturbation theory; semi-confocal open resonator system; surface roughness; temperature 293 K to 298 K; terahertz conductivity; terahertz radiation; Conductivity; Copper; Optical surface waves; Rough surfaces; Surface roughness; Surface topography; Surface waves; Conductivity measurements; electromagnetic (EM) materials characterization; rough surfaces; terahertz (THz) measurements;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2015.2468074
  • Filename
    7234948