Title :
A 2 kfps Sub-µW/Pix Uncooled-PbSe Digital Imager With 10 Bit DR Adjustment and FPN Correction for High-Speed and Low-Cost MWIR Applications
Author :
Margarit, Josep Maria ; Vergara, German ; Villamayor, Victor ; Gutierrez-Alvarez, Raul ; Fernandez-Montojo, Carlos ; Teres, Lluis ; Serra-Graells, Francisco
Author_Institution :
Inst. de Microelectron. de Barcelona, Barcelona, Spain
Abstract :
Mid-wavelength infrared (MWIR) thermography is an emerging technology with promising applications such as industrial monitoring, medicine and automotive, but its use in high-speed cameras is not yet widespread due to the lack of inexpensive sensor integration solutions and their common reliance on bulky cooling mechanisms. This work fills the gap by presenting a monolithic uncooled high-speed imager based on vapor-phase deposition lead selenide (VPD PbSe) photoconductors and a fully digital and configurable CMOS read-out integrated circuit (ROIC) to operate the MWIR imager. This ROIC features cancellation of PbSe dark current, compensation of its output capacitance and correction of the fixed pattern noise (FPN) caused by process non-uniformities in CMOS fabrication and detector deposition. The low-cost 80 × 80 imager has been integrated using 0.35 μm 2P4M standard CMOS technology and PbSe detector post-processing with 135 μm pixel pitch and 68% fill factor values. Experimental opto-electrical performance exhibits 10 bit real-time FPN compensation and DR calibration over the entire focal plane operating at 2 kfps, sub-0.5 LSB inter-pixel crosstalk, sub-μW pixel power consumption, and an overall figure of merit of 55 mK × ms.
Keywords :
CMOS digital integrated circuits; CMOS image sensors; calibration; digital readout; focal planes; infrared imaging; integrated optoelectronics; monolithic integrated circuits; optical crosstalk; photoconducting devices; 2P4M standard CMOS technology; DR adjustment; DR calibration; FPN compensation; FPN correction; LSB interpixel crosstalk; MWIR imager application; configurable CMOS readout integrated circuit; digital CMOS ROIC; figure of merit; fill factor; fixed pattern noise; focal plane; mid wavelength infrared thermography; monolithic uncooled high-speed imager; optoelectrical performance; size 0.35 mum; size 135 mum; vapor phase deposition lead selenide photoconductor; CMOS integrated circuits; CMOS technology; Capacitance; Detectors; Noise; Photoconducting materials; Temperature sensors; CMOS; MWIR; PbSe; digital pixel sensor (DPS); fixed pattern noise (FPN); high speed; imager; infrared; low cost; low power; uncooled;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2015.2464672