Title :
Variable Optical Delay Line Using Discrete Harmonic Oscillation in Waveguide Lattices
Author :
Tenghao Li ; Qingming Chen ; Yunfeng Xiao ; Xuming Zhang
Author_Institution :
Dept. of Appl. Phys., Hong Kong Polytech. Univ., Kowloon, China
Abstract :
This paper proposes a variable optical delay line based on the discrete harmonic oscillation in the waveguide lattice with a quadratic distribution of coupling coefficients. Theoretical analysis and numerical simulation have shown that the device design can achieve a time delay of up to 10 ns, with the resolution of 0.5 ns, and the 3-dB bandwidth over the whole C-band. It allows a data packet of up to 17 bits at the rate of 100 Gb/s. In this design, the propagation path is folded by up to five times (or ten times for the one-port design). Compared with the conventional fiber-delay-line buffer, this design has a small footprint (about 10 mm × 0.5 mm). A group of them can be paralleled and cascaded within a small area (e.g., 20 copies into 1 cm2) as enabled by the microfabrication. With further optimization, this design has a potential for interconnecting and signal processing applications in optical communications and computing.
Keywords :
micro-optics; microfabrication; numerical analysis; optical computing; optical couplers; optical delay lines; optical design techniques; optical fabrication; optical lattices; optical testing; optical waveguides; discrete harmonic oscillation; fiber-delay-line buffer; interconnecting applications; microfabrication; numerical simulation; one-port design; optical communications; optical computing; optical propagation path; quadratic coupling coefficient distribution; signal processing applications; time 0.5 ns; time 10 ns; variable optical delay line; waveguide lattices; Couplings; Dispersion; Mirrors; Optical buffering; Optical pulses; Optical waveguides; Oscillators; Optical buffers; optical computing; optical delay lines; optical planar waveguide components; optical propagation in anisotropic media;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2015.2480542