• DocumentCode
    3606554
  • Title

    a-InGaZnO Active-Matrix Organic LED Pixel Periodically Detecting Thin-Film Transistor Threshold Voltage Once for Multiple Frames

  • Author

    Chih-Lung Lin ; Yen-Ting Liu ; Ching-En Lee ; Po-Syun Chen ; Ting-Ching Chu ; Chia-Che Hung

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    36
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1166
  • Lastpage
    1168
  • Abstract
    This letter proposes a new voltage-programmed amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistor (TFT) pixel circuit for active-matrix organic light-emitting diode (AMOLED) displays. The proposed circuit detects the VTH of the driving TFT only in a periodically executed compensation frame, allowing the other frames to perform only data input and emission for high-speed applications. An HSPICE model is also established based on the measured electrical characteristics of a fabricated a-IGZO TFT. The simulation results reveal that the proposed circuit can compensate for the degradation of the driving TFT and the OLED without external circuits. Moreover, the current error rates are <;6.32%, so the proposed circuit is effective for use in AMOLED displays.
  • Keywords
    LED displays; amorphous semiconductors; error statistics; gallium compounds; indium compounds; organic light emitting diodes; thin film transistors; zinc compounds; AMOLED display; HSPICE model; InGaZnO; a-IGZO TFT pixel circuit; active-matrix organic light emitting diode pixel; current error rate; multiple frame; thin-film transistor; threshold voltage; voltage-programmed amorphous indium-gallium-zinc-oxide; Active matrix organic light emitting diodes; Degradation; Integrated circuit modeling; Lighting; Thin film transistors; Threshold voltage; Active-matrix organic light-emitting diode (AMOLED); amorphous indium-gallium-zinc-oxide (a-IGZO); thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2480861
  • Filename
    7273841