• DocumentCode
    3606861
  • Title

    Nonvolatile Logic and In Situ Data Transfer Demonstrated in Crossbar Resistive RAM Array

  • Author

    Haitong Li ; Zhe Chen ; Wenjia Ma ; Bin Gao ; Peng Huang ; Lifeng Liu ; Xiaoyan Liu ; Jinfeng Kang

  • Author_Institution
    Inst. of Microelectron., Peking Univ., Beijing, China
  • Volume
    36
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1142
  • Lastpage
    1145
  • Abstract
    For the first time, nonvolatile logic, memory, and communication are experimentally demonstrated all within a crossbar resistive random access memory (RRAM) array through the state interaction among RRAM cells. With all the array cells initialized to high resistance states, OR and NOT logic are measured as a proof of functional completeness for computation, with input and output data directly stored in the array. Following the same computation paradigm, in situ data transfer within the crossbar RRAM array is realized. The cell-to-cell communication is proved efficient by the measured resistance evolution of a row of RRAM cells during consecutive data transfer. Reliability characteristics, including endurance, retention, and disturbance are scrutinized for the robust computing systems.
  • Keywords
    logic gates; resistive RAM; NOT logic; OR logic; cell-to-cell communication; crossbar resistive RAM array; crossbar resistive random access memory array; in situ data transfer; nonvolatile logic; Arrays; Current measurement; Data transfer; Nonvolatile memory; Random access memory; Resistance; Switches; Resistive random access memory (RRAM); communication; crossbar array; nonvolatile logic;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2481439
  • Filename
    7274656