DocumentCode
3606861
Title
Nonvolatile Logic and In Situ Data Transfer Demonstrated in Crossbar Resistive RAM Array
Author
Haitong Li ; Zhe Chen ; Wenjia Ma ; Bin Gao ; Peng Huang ; Lifeng Liu ; Xiaoyan Liu ; Jinfeng Kang
Author_Institution
Inst. of Microelectron., Peking Univ., Beijing, China
Volume
36
Issue
11
fYear
2015
Firstpage
1142
Lastpage
1145
Abstract
For the first time, nonvolatile logic, memory, and communication are experimentally demonstrated all within a crossbar resistive random access memory (RRAM) array through the state interaction among RRAM cells. With all the array cells initialized to high resistance states, OR and NOT logic are measured as a proof of functional completeness for computation, with input and output data directly stored in the array. Following the same computation paradigm, in situ data transfer within the crossbar RRAM array is realized. The cell-to-cell communication is proved efficient by the measured resistance evolution of a row of RRAM cells during consecutive data transfer. Reliability characteristics, including endurance, retention, and disturbance are scrutinized for the robust computing systems.
Keywords
logic gates; resistive RAM; NOT logic; OR logic; cell-to-cell communication; crossbar resistive RAM array; crossbar resistive random access memory array; in situ data transfer; nonvolatile logic; Arrays; Current measurement; Data transfer; Nonvolatile memory; Random access memory; Resistance; Switches; Resistive random access memory (RRAM); communication; crossbar array; nonvolatile logic;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2015.2481439
Filename
7274656
Link To Document