DocumentCode :
3606861
Title :
Nonvolatile Logic and In Situ Data Transfer Demonstrated in Crossbar Resistive RAM Array
Author :
Haitong Li ; Zhe Chen ; Wenjia Ma ; Bin Gao ; Peng Huang ; Lifeng Liu ; Xiaoyan Liu ; Jinfeng Kang
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
Volume :
36
Issue :
11
fYear :
2015
Firstpage :
1142
Lastpage :
1145
Abstract :
For the first time, nonvolatile logic, memory, and communication are experimentally demonstrated all within a crossbar resistive random access memory (RRAM) array through the state interaction among RRAM cells. With all the array cells initialized to high resistance states, OR and NOT logic are measured as a proof of functional completeness for computation, with input and output data directly stored in the array. Following the same computation paradigm, in situ data transfer within the crossbar RRAM array is realized. The cell-to-cell communication is proved efficient by the measured resistance evolution of a row of RRAM cells during consecutive data transfer. Reliability characteristics, including endurance, retention, and disturbance are scrutinized for the robust computing systems.
Keywords :
logic gates; resistive RAM; NOT logic; OR logic; cell-to-cell communication; crossbar resistive RAM array; crossbar resistive random access memory array; in situ data transfer; nonvolatile logic; Arrays; Current measurement; Data transfer; Nonvolatile memory; Random access memory; Resistance; Switches; Resistive random access memory (RRAM); communication; crossbar array; nonvolatile logic;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2015.2481439
Filename :
7274656
Link To Document :
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