Title :
Analysis of Solar Array Performance Degradation During Simulated Flashover Discharge Experiments on a Full Panel and Using a Simulator Circuit
Author :
Gerhard, Andreas ; Steins, Wiebke ; Siguier, Jean-Michel ; Inguimbert, Virginie ; Sarrailh, Pierre ; Sevoz, Marc ; Baur, Carsten
Author_Institution :
Airbus DS, Munich, Germany
Abstract :
The main activity of the European Space Agency EMAGS3 study (published at 12th Spacecraft Charging Technology Conference Kitakyushu, Japan) was to simulate in-orbit electrostatic discharge, called flashover, on a flight representative panel of dimensions 2 m × 4 m in an environment to achieve inverted gradient conditions on the solar cells. Electrical performance was measured after the panel has suffered from about 1400 flashovers, some 300 have been recorded and at least 24 of them covered more than 75% of the surface. The comparison with the last measurements before testing revealed no degradation beyond 1%. Obvious differences in the shape of the obtained curves could be attributed to increased serial resistances in the test circuit. A flashover simulation circuit was designed to reproduce the pulse shape measured on the panel. Experiments on single cells using this circuit demonstrated its ability to substitute the flashover in ground tests.
Keywords :
electrostatic discharge; flashover; solar cell arrays; 12th Spacecraft Charging Technology Conference; European Space Agency EMAGS3 study; Japan; Kitakyushu; electrical performance measurement; flight representative panel; in-orbit electrostatic discharge simulation; inverted gradient conditions; pulse shape; serial resistances; simulated flashover discharge experiments; simulator circuit; solar array performance degradation analysis; solar cells; test circuit; Arrays; Current measurement; Degradation; Discharges (electric); Electrostatic discharges; Silicon; Space vehicles; Electrostatic discharge (ESD); flashover; ground experiment; in-orbit ESD; solar cell; solar panel; solar panel.;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2015.2454233