Effects of Energy-Deposition Variability on Soft Error Rate Prediction

Author

Weeden-Wright, Stephanie L. ; King, Michael P. ; Hooten, Nicholas C. ; Bennett, William G. ; Sierawski, Brian D. ; Schrimpf, Ronald D. ; Weller, Robert A. ; Reed, Robert A. ; Mendenhall, Marcus H. ; Fleetwood, Daniel M. ; Alles, Michael L. ; Baumann, Robe

Author_Institution

Dept. of Electr. & Comput. Eng., Vanderbilt Univ., Nashville, TN, USA

Volume

62

Issue

5

fYear

2015

Firstpage

2181

Lastpage

2186

Abstract

Variability in energy deposition caused by intrinsic statistical fluctuations is quantified for specific radiation environments. Differences in effective flux are observed for minimally ionizing particles, typically leading to a decrease in predicted soft error rate, the magnitude of which depends on the threshold LET. When compared to spectra accounting for energy-deposition fluctuations, predictions with traditional LET spectra in CREME96 are found to lead to conservative estimates in almost all situations.

Keywords

radiation hardening (electronics); energy deposition fluctuations; energy deposition variability; minimally ionizing particles; soft error rate prediction; Error analysis; Ionization; Kinetic energy; Monte Carlo methods; Protons; Silicon; CREME96; Monte Carlo simulation; emerging memory; energy deposition fluctuations; energy straggling; ion stopping; radiation effects; single event rate prediction; soft error rate (SER);

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2015.2472296

Filename

7283677