Title :
Effects of Energy-Deposition Variability on Soft Error Rate Prediction
Author :
Weeden-Wright, Stephanie L. ; King, Michael P. ; Hooten, Nicholas C. ; Bennett, William G. ; Sierawski, Brian D. ; Schrimpf, Ronald D. ; Weller, Robert A. ; Reed, Robert A. ; Mendenhall, Marcus H. ; Fleetwood, Daniel M. ; Alles, Michael L. ; Baumann, Robe
Author_Institution :
Dept. of Electr. & Comput. Eng., Vanderbilt Univ., Nashville, TN, USA
Abstract :
Variability in energy deposition caused by intrinsic statistical fluctuations is quantified for specific radiation environments. Differences in effective flux are observed for minimally ionizing particles, typically leading to a decrease in predicted soft error rate, the magnitude of which depends on the threshold LET. When compared to spectra accounting for energy-deposition fluctuations, predictions with traditional LET spectra in CREME96 are found to lead to conservative estimates in almost all situations.
Keywords :
radiation hardening (electronics); energy deposition fluctuations; energy deposition variability; minimally ionizing particles; soft error rate prediction; Error analysis; Ionization; Kinetic energy; Monte Carlo methods; Protons; Silicon; CREME96; Monte Carlo simulation; emerging memory; energy deposition fluctuations; energy straggling; ion stopping; radiation effects; single event rate prediction; soft error rate (SER);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2472296
