DocumentCode :
3607378
Title :
High Extinction Ratio and Broadband Silicon TE-Pass Polarizer Using Subwavelength Grating Index Engineering
Author :
Yule Xiong ; Dan-Xia Xu ; Schmid, Jens H. ; Cheben, Pavel ; Ye, Winnie N.
Author_Institution :
Nat. Res. Council Canada, Inf. & Commun. Technol., Moncton, NB, Canada
Volume :
7
Issue :
5
fYear :
2015
Firstpage :
1
Lastpage :
7
Abstract :
We propose and experimentally demonstrate a novel approach to implement a low-loss, broadband, and compact transverse electric (TE)-pass polarizer on a silicon-on-insulator platform. The TE-polarizer utilizes a subwavelength grating (SWG) structure to engineer the waveguide equivalent material index. In this paper, the SWG-based polarizer only supports its fundamental TE mode, whereas the transverse magnetic (TM) mode is suppressed under the cutoff condition, i.e., the TM mode leaks from the waveguide with low reflection. The simulations predict that the bandwidth to achieve a polarization extinction ratio (ER) of 35 dB exceeds 200 nm. Experimentally, the measured polarization ER is ~30 dB, and the average insertion loss is 0.4 dB in the wavelength range of 1470-1580 nm. The fabricated TE-polarizer has a compact length of 60 μm.
Keywords :
diffraction gratings; elemental semiconductors; integrated optics; optical losses; optical polarisers; optical waveguides; reflectivity; silicon; silicon-on-insulator; Si; broadband silicon TE-pass polarizer; broadband transverse electric pass polarizer; compact transverse electric pass polarizer; cutoff condition; high extinction ratio; insertion loss; low reflection; low-loss transverse electric pass polarizer; polari- zation extinction ratio; silicon-on-insulator platform; subwavelength grating index engineering; waveguide equivalent material index; Fabrication; Gratings; Indexes; Loss measurement; Reflection; Refractive index; Silicon; Waveguides; silicon nanophotonics; subwavelength structures; waveguides;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2015.2483204
Filename :
7286730
Link To Document :
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