• DocumentCode
    3607522
  • Title

    A 14 b 35 MS/s SAR ADC Achieving 75 dB SNDR and 99 dB SFDR With Loop-Embedded Input Buffer in 40 nm CMOS

  • Author

    Kramer, Martin J. ; Janssen, Erwin ; Doris, Kostas ; Murmann, Boris

  • Author_Institution
    Stanford Univ., Stanford, CA, USA
  • Volume
    50
  • Issue
    12
  • fYear
    2015
  • Firstpage
    2891
  • Lastpage
    2900
  • Abstract
    This paper presents a 14 bit 35 MS/s successive approximation register (SAR) ADC that achieves a nearly constant 74.5 dB peak SNDR up to Nyquist and an SFDR of 90/99 dB for inputs near Nyquist and at low-frequencies, respectively. The ADC employs a loop-embedded input buffer that shields the large sampling capacitor from the input and thereby eases the ADC drive requirements significantly. Since the buffer´s nonlinearity is cancelled by the SAR operation, a pair of basic source followers can be used, adding only 12.5 mW (23% of the total power) to the power budget. The ADC includes a bandgap reference and a self-calibrated current steering DAC to close the SAR loop, which eliminates the need for a low-impedance off-chip reference. The design occupies 0.236 mm 2 in 40 nm CMOS and consumes a total power of 54.5 mW from its 1.2/2.5 V supplies, leading to an SNDR-based Schreier FOM of 159.5 dB at Nyquist.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; buffer circuits; capacitors; digital-analogue conversion; CMOS technology; SAR ADC; SFDR; SNDR; bandgap reference; loop-embedded input buffer; low-impedance off-chip reference; noise figure 159.5 dB; noise figure 75 dB; noise figure 90 dB; noise figure 99 dB; power 12.5 mW; power 54.5 mW; sampling capacitor; self-calibrated current steering DAC; size 40 nm; source follower; successive approximation register; voltage 1.2 V; voltage 2.5 V; word length 14 bit; Approximation methods; CMOS integrated circuits; Capacitance; Distortion; Integrated circuit modeling; Noise; Resistors; Analog-to-digital conversion; CMOS; SAR; buffer amplifier; calibration; current steering DAC; redundancy; sampling; successive approximation register;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2015.2463110
  • Filename
    7287803