DocumentCode
3607620
Title
Accelerated Testing of Radiation-Induced Soft Errors in Solid-State Drives
Author
Mielke, Neal ; Goodwin, Kodie ; Harris, Rory ; Kumar, Arbin ; Lin, Eric ; Parekh, Vineet ; Boyang Zhang ; Zweig, Matt
Author_Institution
Intel Corp., Folsom, CA, USA
Volume
15
Issue
4
fYear
2015
Firstpage
552
Lastpage
558
Abstract
Accelerated soft error testing with neutron and proton beams was done on a variety of solid-state drives. Effects included temporary hangs, permanent drive failure, and both detected and silent data corruption. Projected rates for sea-level cosmic rays vary widely from model to model, which is arguably insignificant for some but problematic for others. Design protections for reducing soft error sensitivity are discussed and evaluated for effectiveness. Radiation testing was able to detect silent data corruption at levels 10 000 times lower than can be detected in a conventional reliability demonstration test. We argue that accelerated testing should be a standard part of drive design validation.
Keywords
NAND circuits; failure analysis; flash memories; integrated circuit design; life testing; neutron beams; proton beams; radiation hardening (electronics); accelerated soft error testing; design protections; drive design validation; neutron beams; permanent drive failure; proton beams; radiation testing; radiation-induced soft errors; sea-level cosmic rays; silent data corruption; soft error sensitivity reduction; solid-state drives; temporary hangs; Bars; Cosmic rays; Drives; Error correction codes; Materials reliability; Random access memory; Testing; Soft errors; silent data corruption; single event upsets; single-event upsets; solid state drives; solid-state drives;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2015.2486762
Filename
7289417
Link To Document