Title :
Accelerated Testing of Radiation-Induced Soft Errors in Solid-State Drives
Author :
Mielke, Neal ; Goodwin, Kodie ; Harris, Rory ; Kumar, Arbin ; Lin, Eric ; Parekh, Vineet ; Boyang Zhang ; Zweig, Matt
Author_Institution :
Intel Corp., Folsom, CA, USA
Abstract :
Accelerated soft error testing with neutron and proton beams was done on a variety of solid-state drives. Effects included temporary hangs, permanent drive failure, and both detected and silent data corruption. Projected rates for sea-level cosmic rays vary widely from model to model, which is arguably insignificant for some but problematic for others. Design protections for reducing soft error sensitivity are discussed and evaluated for effectiveness. Radiation testing was able to detect silent data corruption at levels 10 000 times lower than can be detected in a conventional reliability demonstration test. We argue that accelerated testing should be a standard part of drive design validation.
Keywords :
NAND circuits; failure analysis; flash memories; integrated circuit design; life testing; neutron beams; proton beams; radiation hardening (electronics); accelerated soft error testing; design protections; drive design validation; neutron beams; permanent drive failure; proton beams; radiation testing; radiation-induced soft errors; sea-level cosmic rays; silent data corruption; soft error sensitivity reduction; solid-state drives; temporary hangs; Bars; Cosmic rays; Drives; Error correction codes; Materials reliability; Random access memory; Testing; Soft errors; silent data corruption; single event upsets; single-event upsets; solid state drives; solid-state drives;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2015.2486762