DC Temperature Measurements to Characterize the Central Frequency and 3 dB Bandwidth in mmW Power Amplifiers

Author

Aragones, Xavier ; Mateo, D. ; Gonzalez, J.L. ; Vidal, E. ; Gomez, D. ; Martineau, B. ; Altet, J.

Author_Institution

Electron. Eng. Dept., Univ. Politec. de Catalunya, Barcelona, Spain

Volume

25

Issue

11

fYear

2015

Firstpage

745

Lastpage

747

Abstract

This letter shows how a temperature sensor and a simple dc voltage multimeter can be used as instruments to determine the central frequency and 3 dB bandwidth of a 60 GHz linear power amplifier (PA). Compared to previous works, the dc temperature monitoring now proposed requires a much simpler and convenient measurement set-up. In this example, the temperature sensor is embedded in the same silicon die as the PA. Being placed in empty layout spaces next to it, it is proposed as a built-in test circuit.

Keywords

millimetre wave power amplifiers; multimeters; temperature sensors; DC temperature measurements; built-in test circuit; central frequency; dc temperature monitoring; frequency 60 GHz; linear power amplifier; mmW power amplifiers; silicon die; simple dc voltage multimeter; temperature sensor; CMOS integrated circuits; Design for testability; Frequency response; Power amplifiers; Temperature measurement; Thermal sensors; Built-in test; CMOS millimeter wave integrated circuits; design for testability; temperature measurement;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2015.2479848

Filename

7293238