DocumentCode :
3607942
Title :
Material Characterization and Transfer of Large-Area Ultra-Thin Polydimethylsiloxane Membranes
Author :
Jinsheng Gao ; Dongzhi Guo ; Santhanam, Suresh ; Fedder, Gary K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
24
Issue :
6
fYear :
2015
Firstpage :
2170
Lastpage :
2177
Abstract :
Fabrication of ultra-thin (1-20-μm thickness) polydimethylsiloxane (PDMS) films is enabled with a hexane dilution process and an underlying gelatin release layer. The release and transfer of these films over large areas (>5 cm) allows measurement of the thickness-dependent and process-dependent mechanical properties of ultra-thin PDMS membranes, reported for the first time. The effective Young´s modulus of 1-μm-thick PDMS, measured by bulge testing, is approximately ten times larger than that of 0.5-mm-thick material, following a continuous power-law relationship over the entire thickness range. Mesh-patterned metal electrodes of 2-μm minimum feature size are embedded in selected membranes. Metal evaporation and subsequent reactive ion etch patterning on PDMS increases its Young´s modulus due to the increase in cross-link formation and hardening of the surface. The results are meaningful in design and fabrication of soft electronics, microsensors, microvalves, and micropumps.
Keywords :
Young´s modulus; membranes; polymer films; sputter etching; surface hardening; PDMS; bulge testing; continuous power-law relationship; effective Young´s modulus; hexane dilution process; large-area ultrathin polydimethylsiloxane membranes; material characterization; mesh-patterned metal electrodes; metal evaporation; process-dependent mechanical properties; reactive ion etch patterning; size 0.5 mum; size 1 mum to 20 mum; surface hardening; thickness-dependent mechanical properties; ultrathin polydimethylsiloxane films; underlying gelatin release layer; Fabrication; Mechanical factors; Metals; Polymers; Silicon; Substrates; Young´s modulus; MEMS; PDMS; material charaterization; material charaterization.; microfabrication; thin film polymer;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2015.2480388
Filename :
7294621
Link To Document :
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