• DocumentCode
    3608431
  • Title

    A High-Linearity, 30 GS/s Track-and-Hold Amplifier and Time Interleaved Sample-and-Hold in an InP-on-CMOS Process

  • Author

    Madsen, Kristian N. ; Gathman, Timothy D. ; Daneshgar, Saeid ; Oh, Thomas C. ; Li, James Chingwei ; Buckwalter, James F.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
  • Volume
    50
  • Issue
    11
  • fYear
    2015
  • Firstpage
    2692
  • Lastpage
    2702
  • Abstract
    A high-speed, track-and-hold amplifier and interleaved CMOS sample-and-hold circuit are implemented in an InP-on-CMOS fabrication process. Conventional 50- Ω interchip interconnects between III-V and CMOS circuits are eliminated with heterogeneous integration of III-V on CMOS, yielding higher performance circuits at lower power consumption. The track-and-hold amplifier is based on a double-switching feedback architecture using 250 nm InP HBTs and achieves an IIP3 of 19 dBm at a sampling rate of 30 GS/s. To the author´s knowledge, this is the first published result of a high-speed track-and-hold amplifier in an InP BiCMOS process and the first implementation of a feedback linearized track-and-hold at a sampling rate above 2 GS/s. Additionally, a novel HBT buffer with feedback is demonstrated to offer high linearity and low power for driving time-interleaved CMOS sample-and-hold circuits. A 90 nm time-interleaved CMOS sample-and-hold circuit is demonstrated to achieve better than -53 dBc HD3 at a sampling rate of 5 GS/s while consuming roughly 24 mW per channel.
  • Keywords
    BiCMOS integrated circuits; CMOS integrated circuits; III-V semiconductors; amplifiers; heterojunction bipolar transistors; high-speed integrated circuits; integrated circuit interconnections; integrated circuit manufacture; low-power electronics; sample and hold circuits; BiCMOS; CMOS fabrication process; HBT; IIP3; InP; double-switching feedback architecture; interchip interconnects; power 24 mW; power consumption; resistance 50 ohm; size 250 nm; time interleaved sample-and-hold; track-and-hold amplifier; CMOS integrated circuits; CMOS technology; Capacitors; Heterojunction bipolar transistors; III-V semiconductor materials; Indium phosphide; Noise; Analog-to-digital converter (ADC); BiCMOS; InP-on-CMOS; double switching; feedback linearization; mixed-signal; track-and-hold amplifier (THA);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2015.2472642
  • Filename
    7299333