DocumentCode :
3608431
Title :
A High-Linearity, 30 GS/s Track-and-Hold Amplifier and Time Interleaved Sample-and-Hold in an InP-on-CMOS Process
Author :
Madsen, Kristian N. ; Gathman, Timothy D. ; Daneshgar, Saeid ; Oh, Thomas C. ; Li, James Chingwei ; Buckwalter, James F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
Volume :
50
Issue :
11
fYear :
2015
Firstpage :
2692
Lastpage :
2702
Abstract :
A high-speed, track-and-hold amplifier and interleaved CMOS sample-and-hold circuit are implemented in an InP-on-CMOS fabrication process. Conventional 50- Ω interchip interconnects between III-V and CMOS circuits are eliminated with heterogeneous integration of III-V on CMOS, yielding higher performance circuits at lower power consumption. The track-and-hold amplifier is based on a double-switching feedback architecture using 250 nm InP HBTs and achieves an IIP3 of 19 dBm at a sampling rate of 30 GS/s. To the author´s knowledge, this is the first published result of a high-speed track-and-hold amplifier in an InP BiCMOS process and the first implementation of a feedback linearized track-and-hold at a sampling rate above 2 GS/s. Additionally, a novel HBT buffer with feedback is demonstrated to offer high linearity and low power for driving time-interleaved CMOS sample-and-hold circuits. A 90 nm time-interleaved CMOS sample-and-hold circuit is demonstrated to achieve better than -53 dBc HD3 at a sampling rate of 5 GS/s while consuming roughly 24 mW per channel.
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; III-V semiconductors; amplifiers; heterojunction bipolar transistors; high-speed integrated circuits; integrated circuit interconnections; integrated circuit manufacture; low-power electronics; sample and hold circuits; BiCMOS; CMOS fabrication process; HBT; IIP3; InP; double-switching feedback architecture; interchip interconnects; power 24 mW; power consumption; resistance 50 ohm; size 250 nm; time interleaved sample-and-hold; track-and-hold amplifier; CMOS integrated circuits; CMOS technology; Capacitors; Heterojunction bipolar transistors; III-V semiconductor materials; Indium phosphide; Noise; Analog-to-digital converter (ADC); BiCMOS; InP-on-CMOS; double switching; feedback linearization; mixed-signal; track-and-hold amplifier (THA);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2015.2472642
Filename :
7299333
Link To Document :
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