Title :
Overview on Sustainability, Robustness, and Reliability of GaN Single-Chip LED Devices
Author :
Deshayes, Yannick ; Baillot, Raphael ; Joly, Simon ; Ousten, Yves ; Bechou, Laurent
Author_Institution :
Center of Excellence Laser in Aquitaine, Univ. of Bordeaux, Talence, France
Abstract :
This paper gave an actual overview of sustainability, robustness, and reliability of GaN-based LED devices. This overview deals with low- and medium-power LED composed of a single chip and details the main functional parameters to regard to estimate performance drifts of the technology related to application.
Keywords :
III-V semiconductors; LED displays; gallium compounds; low-power electronics; semiconductor device reliability; wide band gap semiconductors; GaN; low-power LED; main functional parameters; medium-power LED; performance drifts; reliability; robustness; single-chip LED devices; sustainability; Aging; Fluorescence; Gallium nitride; Integrated optics; Light emitting diodes; Polymers; Reliability; LED; Light source; Reliability; Street lamp; light source; reliability; street lamp;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2015.2488978
