CMOS 65 nm ´on chip´ broadband real time substrate noise measurement

Author

Noulis, T. ; Lourandakis, E. ; Stefanou, S. ; Merakos, P.

Author_Institution

Phys. Dept., Aristotle Univ. of Thesaloniki, Thessaloniki, Greece

Volume

51

Issue

21

fYear

2015

Firstpage

1710

Lastpage

1711

Abstract

A CMOS 65 nm substrate crosstalk noise sensor with exceptional performance characteristics was implemented. The sensor is integrated and fabricated onto the same die with a pin-grid array packaged ZigBee transceiver. It provides a gain of 6.5 dB in an operating bandwidth from 1 MHz to 4.5 GHz and a -1 dB gain compression point for an input signal amplitude of 124 mV. Its superior substrate noise sensing capacity is demonstrated using measurements in an advanced wireless communication system on chip, having a programmable CMOS control logic of 120 kGate acting as the substrate noise transmitter.

Keywords

CMOS integrated circuits; Zigbee; electronics packaging; noise measurement; programmable logic devices; radio transceivers; system-on-chip; CMOS on chip; CMOS substrate crosstalk noise sensor; ZigBee transceiver; bandwidth 1 MHz to 4.5 GHz; broadband real time substrate noise measurement; gain -1 dB; gain 6.5 dB; pin grid array package; programmable CMOS control logic; size 65 nm; substrate noise transmitter; system on chip; voltage 124 mV; wireless communication;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el.2015.2099

Filename

7300524