• DocumentCode
    3608919
  • Title

    A New Model of Outer Belt Electrons for Dielectric Internal Charging (MOBE-DIC)

  • Author

    Hands, Alex ; Ryden, Keith ; Underwood, Craig ; Rodgers, David ; Evans, Hugh

  • Author_Institution
    Surrey Space Centre, Univ. of Surrey, Guildford, UK
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • Firstpage
    2767
  • Lastpage
    2775
  • Abstract
    The outer electron belt poses a significant radiation hazard to spacecraft due to internal charging and dose effects. We present a new user-friendly model to characterise the worst-case environment built on data from the Giove-A spacecraft. We use instrument data based on a novel technique of direct charging current measurements, uncontaminated by protons and unaffected by dead-time, to create the model. The model provides integral or differential electron flux spectra with the following input parameters: percentile 90%, 99% or 100%; L-shell range 3-8; Magnetic Latitude ( B/B0) range 1-100; Energy range 0.5-3 MeV. Comparisons with other models and independent data sets show that our “Model of Outer Belt Electrons for Dielectric Internal Charging” (MOBE-DIC) provides a sound worst-case specification for mission planners and design engineers. We find that, in medium Earth orbit particularly, MOBE-DIC indicates a harder electron spectrum than either AE9 or FLUMIC.
  • Keywords
    Earth orbit; electrons; hazards; radiation belts; spacecraft charging; Giove-A spacecraft; MOBE-DIC; differential electron flux spectra; direct charging current measurement; dose effects; electron spectrum; integral electron flux spectra; magnetic latitude; medium Earth orbit; model of outer belt electrons for dielectric internal charging; radiation hazard; Data models; Dielectrics; Electrostatic discharges; Extraterrestrial measurements; Orbits; Space vehicles; Giove spacecraft; Van Allen belts; internal charging; trapped electron flux;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2475134
  • Filename
    7305843