Title :
Semi-Supervised Image Classification Based on Local and Global Regression
Author :
Mingbo Zhao ; Choujun Zhan ; Zhou Wu ; Peng Tang
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
Abstract :
The insufficiency of labeled samples is a major problem in automatic image annotation. However, unlabeled samples are readily available and abundant. Hence, semi-supervised learning methods, which utilize partly labeled samples and a large amount of unlabeled samples, have attracted increased attention in the field of image classification. During the past decade, graph-based semi-supervised learning became one of the most important research areas in semi-supervised learning. In this letter, we propose a novel and effective graph based semi-supervised learning method for image classification. The new method is based on local and global regression regularization. The local regression regularization adopts a set of local classification functions to preserve both local discriminative and geometrical information; while the global regression regularization preserves the global discriminative information and calculates the projection matrix for out-of-sample extrapolation. Extensive simulations based on synthetic and real-world datasets verify the effectiveness of the proposed method.
Keywords :
extrapolation; graph theory; image classification; learning (artificial intelligence); matrix algebra; regression analysis; automatic image annotation; global discriminative information; global regression regularization; graph-based semisupervised learning method; local classification function; local discriminative information; local geometrical information; local regression regularization; out-of-sample extrapolation; projection matrix; semisupervised image classification; Laplace equations; Manifolds; Matrices; Semisupervised learning; Supervised learning; Support vector machines; Bias reduction; local and global regression; semi-supervised learning;
Journal_Title :
Signal Processing Letters, IEEE
DOI :
10.1109/LSP.2015.2421971