• DocumentCode
    3609110
  • Title

    Reliability Analysis of Ku-Band 5-bit Phase Shifters Using MEMS SP4T and SPDT Switches

  • Author

    Dey, Sukomal ; Koul, Shiban K.

  • Author_Institution
    Centre for Appl. Res. in Electron., Indian Inst. of Technol. Delhi, New Delhi, India
  • Volume
    63
  • Issue
    12
  • fYear
    2015
  • Firstpage
    3997
  • Lastpage
    4012
  • Abstract
    This work presents a Ku-band microelectromechanical systems (MEMS) based 5-bit phase shifter using dc contact single-pole-four-throw (SP4T) and single-pole-double-throw switches. The design is implemented using a coplanar waveguide transmission line. Two individual 2-bit phase shifters and one 1-bit phase shifter are cascaded to develop the complete 5-bit phase shifter. The phase shifters are fabricated on 635- μm alumina substrate using a surface micromachining process. The 5-bit phase shifter demonstrates an average insertion loss of 2.65 dB in the 13-18-GHz band with a return loss better than 22 dB and average phase error less than 0.68 ° at 17 GHz. Total area of the fabricated 5-bit phase shifter is 4.7 × 2.8 mm2. The reliability of the single-pole-single-throw and SP4T switches show more than 10 million cycles with an RF power of 0.1-2 W. Furthermore, reliability of the MEMS phase shifter is extensively investigated and presented with cold and hot switched conditions. To the best of our knowledge, this is the first reported MEMS 5-bit phase shifter in the literature that has undergone different reliability and qualification testing including 3-axis vibrations.
  • Keywords
    alumina; circuit reliability; coplanar waveguides; electrical contacts; micromachining; microswitches; microwave phase shifters; 3-axis vibration; DC contact single-pole-four-throw switch; Ku-band; MEMS; RF power; SP4T switch; SPDT switch; alumina substrate; coplanar waveguide transmission line; frequency 13 GHz to 18 GHz; insertion loss; loss 2.65 dB; microelectromechanical system; phase error; phase shifter; power 0.1 W to 2 W; qualification testing; reliability analysis; single-pole-double-throw switch; size 635 mum; surface micromachining process; word length 1 bit; word length 2 bit; word length 5 bit; Micromechanical devices; Phase shifters; Reliability; Switches; Temperature measurement; Transmission line measurements; Voltage measurement; Contact resistance; RF microelectromechanical system (RF MEMS); dc contact; phase shifter;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2015.2491938
  • Filename
    7308091