DocumentCode :
3609496
Title :
Analysis and Equivalent-Circuit Model for CMOS On-Chip Multiple Coupled Inductors in the Millimeter-Wave Region
Author :
Zongzhi Gao ; Kai Kang ; Zhengdong Jiang ; Yunqiu Wu ; Chenxi Zhao ; Yong-Lin Ban ; Lingling Sun ; Quan Xue ; Wen-Yan Yin
Author_Institution :
Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
62
Issue :
12
fYear :
2015
Firstpage :
3957
Lastpage :
3964
Abstract :
A growing number of on-chip inductors have been applied in the millimeter-wave IC design. The coupling effects between them have a negative impact on the performance of the circuit and each on-chip inductor. In this paper, a new equivalent-circuit model and a parameter extraction method for multiple on-chip inductors in the millimeter-wave region are proposed. The impacts of coupling effects on every onchip inductor are comprehensive considered in the proposed parameter extraction method. The characteristics of the multiple on-chip-coupled inductors are analyzed, modeled, and measured. The test structures were fabricated by 0.18-μm and 90-nm CMOS processes. The inductances, quality factors, and S-parameters of the model agree well with the measured performance of on-chip-nested and side-by-side-coupled inductors over a wide frequency range from 10 MHz up to millimeter-wave frequency band.
Keywords :
CMOS integrated circuits; Q-factor; S-parameters; equivalent circuits; inductors; millimetre wave integrated circuits; CMOS on-chip multiple coupled inductors; S-parameters; equivalent-circuit model; millimeter-wave IC design; millimeter-wave region; multiple on-chip inductors; parameter extraction method; quality factors; size 0.18 mum; size 90 nm; CMOs technology; Capacitance; Equivalent circuits; Inductors; Millimeter wave technology; Semiconductor device modeling; System-on-chip; CMOS; equivalent-circuit model; millimeter wave; multiple coupled inductors; nested coupled inductors; nested coupled inductors.;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2488840
Filename :
7312452
Link To Document :
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