Title :
SEL Hardness Assurance in a Mixed Radiation Field
Author :
Garcia Alia, Ruben ; Brugger, Markus ; Danzeca, Salvatore ; Ferlet-Cavrois, Veronique ; Frost, Christopher ; Gaillard, Remi ; Mekki, Julien ; Saigne, Frederic ; Thornton, Adam ; Uznanski, Slawosz ; Wrobel, Frederic
Author_Institution :
CERN, Genève, Switzerland
Abstract :
This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semi-empirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds.
Keywords :
flip-flops; integrated circuit measurement; integrated circuit reliability; logic testing; radiation hardening (electronics); SEL hardness assurance; hadron cross section; mixed radiation field; monoenergetic measurements; single event latchup; soft mixed field spectra; Large Hadron Collider; Monte Carlo methods; Single event latchups; Single event upsets; Tungsten; CERN; CHARM radiation facility; FLUKA; Monte Carlo methods; hardness assurance; high-Z materials; large hadron collider (LHC); single event latchup (SEL);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2477597