DocumentCode
3609569
Title
Charge character in the double-barrier quantum dots in well hybrid structure
Author
Wenguo Ning ; Weiwei Wang ; Xiaobo Jin ; Fangmin Guo ; Fangyu Yue
Author_Institution
Shanghai Key Lab. of Multidimensional Inf. Process., East China Normal Univ., Shanghai, China
Volume
10
Issue
10
fYear
2015
Firstpage
533
Lastpage
536
Abstract
The charge character in the double-barrier quantum dots (QDs) in a well hybrid structure is investigated experimentally and numerically. The capacitance hysteresis phenomenon of a double-barrier InAs QDs and InGaAs quantum well hybrid structure is reported, as well as the carrier transport properties in the photoelectric device. Due to the coupling effect among multiple QDs, the photoelectric device´s measured I-V and C-V curves show that the capacitance changes with the light intensity. When the dumping readout designed, it can enhance the sensitivity of the device at weak light illumination. This indicates that the photoelectric device has the potential to be a promising candidate both in quantum information applications and highly sensitive imaging applications.
Keywords
III-V semiconductors; capacitance; gallium arsenide; indium compounds; semiconductor quantum dots; semiconductor quantum wells; C-V curves; I-V curves; InAs; InGaAs; capacitance hysteresis; carrier transport properties; charge character; coupling effect; double-barrier quantum dots; dumping readout; light intensity; photoelectric device; quantum well hybrid structure; weak light illumination;
fLanguage
English
Journal_Title
Micro Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2015.0188
Filename
7312581
Link To Document