• DocumentCode
    3609569
  • Title

    Charge character in the double-barrier quantum dots in well hybrid structure

  • Author

    Wenguo Ning ; Weiwei Wang ; Xiaobo Jin ; Fangmin Guo ; Fangyu Yue

  • Author_Institution
    Shanghai Key Lab. of Multidimensional Inf. Process., East China Normal Univ., Shanghai, China
  • Volume
    10
  • Issue
    10
  • fYear
    2015
  • Firstpage
    533
  • Lastpage
    536
  • Abstract
    The charge character in the double-barrier quantum dots (QDs) in a well hybrid structure is investigated experimentally and numerically. The capacitance hysteresis phenomenon of a double-barrier InAs QDs and InGaAs quantum well hybrid structure is reported, as well as the carrier transport properties in the photoelectric device. Due to the coupling effect among multiple QDs, the photoelectric device´s measured I-V and C-V curves show that the capacitance changes with the light intensity. When the dumping readout designed, it can enhance the sensitivity of the device at weak light illumination. This indicates that the photoelectric device has the potential to be a promising candidate both in quantum information applications and highly sensitive imaging applications.
  • Keywords
    III-V semiconductors; capacitance; gallium arsenide; indium compounds; semiconductor quantum dots; semiconductor quantum wells; C-V curves; I-V curves; InAs; InGaAs; capacitance hysteresis; carrier transport properties; charge character; coupling effect; double-barrier quantum dots; dumping readout; light intensity; photoelectric device; quantum well hybrid structure; weak light illumination;
  • fLanguage
    English
  • Journal_Title
    Micro Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2015.0188
  • Filename
    7312581