DocumentCode :
3609569
Title :
Charge character in the double-barrier quantum dots in well hybrid structure
Author :
Wenguo Ning ; Weiwei Wang ; Xiaobo Jin ; Fangmin Guo ; Fangyu Yue
Author_Institution :
Shanghai Key Lab. of Multidimensional Inf. Process., East China Normal Univ., Shanghai, China
Volume :
10
Issue :
10
fYear :
2015
Firstpage :
533
Lastpage :
536
Abstract :
The charge character in the double-barrier quantum dots (QDs) in a well hybrid structure is investigated experimentally and numerically. The capacitance hysteresis phenomenon of a double-barrier InAs QDs and InGaAs quantum well hybrid structure is reported, as well as the carrier transport properties in the photoelectric device. Due to the coupling effect among multiple QDs, the photoelectric device´s measured I-V and C-V curves show that the capacitance changes with the light intensity. When the dumping readout designed, it can enhance the sensitivity of the device at weak light illumination. This indicates that the photoelectric device has the potential to be a promising candidate both in quantum information applications and highly sensitive imaging applications.
Keywords :
III-V semiconductors; capacitance; gallium arsenide; indium compounds; semiconductor quantum dots; semiconductor quantum wells; C-V curves; I-V curves; InAs; InGaAs; capacitance hysteresis; carrier transport properties; charge character; coupling effect; double-barrier quantum dots; dumping readout; light intensity; photoelectric device; quantum well hybrid structure; weak light illumination;
fLanguage :
English
Journal_Title :
Micro Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2015.0188
Filename :
7312581
Link To Document :
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