• DocumentCode
    3609581
  • Title

    Low-Jitter Design for 25-Gb/s CMOS-Based Optical Interconnects

  • Author

    Takemoto, Takashi ; Yamashita, Hiroki ; Matsuoka, Yasunobu ; Yong Lee ; Yazaki, Toru ; Chujo, Norio ; Kokubo, Masaru

  • Author_Institution
    R&D Group, Hitachi, Ltd., Kokubunji, Japan
  • Volume
    33
  • Issue
    23
  • fYear
    2015
  • Firstpage
    4891
  • Lastpage
    4898
  • Abstract
    Jitter of a 25-Gb/s optical link is numerically and experimentally analyzed. The numerical analysis shows that a 25-Gb/s optical transceiver needs retiming circuits in its transmitter and receiver in order to satisfy the targeted jitter budget of the optical link. Because the random jitter (RJ) largely contributes the total jitter of the 25-Gb/s optical link, an equation for calculating the RJ caused by relative intensity noise (RIN) was experimentally derived. According to the calculated RJ, the rise and fall times of an optical transmitter must be shortened to less than 19 ps to satisfy the targeted total jitter (less than 0.6 UI) at vertical-cavity surface-emitting laser (VCSEL) temperature of 80 °C. Moreover, a CMOS-based optical link, which consists of a VCSEL and a photodiode operating at 850-nm wavelength, a CMOS laser diode (LD) driver, and a CMOS transimpedance amplifier, was developed. The LD driver applies an asymmetric equalizer to shorten the fall time because nonlinear effects of a VCSEL generally make the fall time longer than the rise time. The experimental analysis of the developed optical link demonstrated total jitter of 0.58 UI (excluding deterministic jitter of an electrical interface) at data rate of 25 Gb/s.
  • Keywords
    CMOS integrated circuits; equalisers; integrated optics; integrated optoelectronics; jitter; laser cavity resonators; operational amplifiers; optical design techniques; optical interconnections; optical links; optical noise; optical transceivers; photodiodes; surface emitting lasers; CMOS laser diode driver; CMOS transimpedance amplifier; CMOS-based optical interconnects; RIN; VCSEL; asymmetric equalizer; bit rate 25 Gbit/s; low-jitter design; optical link; optical receiver; optical transceiver; optical transmitter; photodiode; random jitter; relative intensity noise; retiming circuits; temperature 80 degC; vertical cavity surface emitting laser; wavelength 850 nm; Integrated optics; Jitter; Optical fibers; Optical interconnections; Optical sensors; Vertical cavity surface emitting lasers; 25-Gb/s optical link; 850-nm wavelength; CMOS LD driver; CMOS TIA; Jitter analysis; RIN; VCSEL; jitter analysis;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2015.2493039
  • Filename
    7312893