Title :
PCB Near-Field Transient Emission Time-Domain Model
Author :
Ravelo, Blaise ; Yang Liu ; Jastrzebski, Adam K.
Author_Institution :
Grad. Sch. of Eng., Res. Inst. on Electron. & Embedded Syst., St. Etienne du Rouvray, France
Abstract :
This study is aimed at the time-domain (TD) electromagnetic compatibility (EMC) modeling of a planar near-field (NF) emission. The radiated EMC model is built, consisting of elementary dipole array, capable of accurate reproduction of NFs emitted by electronic circuits with transient excitations of nanoseconds duration. The details of the modeling approach are explained. The determination method of dipole parameters from the given time-dependent scanned 3-D electromagnetic (EM) field is developed. The proposed TD model was validated first with ideal sources excited by electrostatic discharge standard surge currents. Then, it was validated with the experimental scanned magnetic NF radiated by a microstrip circuit excited by a pulse RF signal. The magnetic field predictions confirmed the modeling procedure correctness. Modeling errors in reproducing the scanned transient 3-D EM field were better than 0.1%. Errors in NF to NF transformation of the transient EM field were in the range of 2%. The suggested model is particularly useful for the EMC NF emission investigation of modern multifunctional electronic systems with a mixture of analogue and digital blocks generating transient and impulse disturbances.
Keywords :
electromagnetic compatibility; electromagnetic fields; microstrip circuits; printed circuit layout; printed circuit testing; time-domain analysis; EMC NF emission; EMC modeling; NF transformation; PCB near-field transient emission time-domain model; TD electromagnetic compatibility modeling; analogue blocks; digital blocks; dipole parameters; electronic circuits; electrostatic discharge standard surge currents; elementary dipole array; impulse disturbances; magnetic field predictions; microstrip circuit; multifunctional electronic systems; nanosecond duration; planar NF emission; pulse RF signal; scanned transient 3D EM field; time-dependent scanned 3D electromagnetic field; transient disturbances; transient excitations; Computational modeling; Electromagnetic compatibility; Integrated circuit modeling; Mathematical model; Noise measurement; Numerical models; Transient analysis; Dipole array; electromagnetic compatibility (EMC) emission; near-field (NF) radiation; time-domain (TD) model; transient perturbation;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2015.2438053