DocumentCode :
3610080
Title :
Zero-Dimensional Theoretical Model of Subnanosecond High-Pressure Gas Discharge
Author :
Kozyrev, Andrey V. ; Kozhevnikov, Vasily Yu ; Semeniuk, Natalia S.
Author_Institution :
Tomsk State Univ., Tomsk, Russia
Volume :
43
Issue :
12
fYear :
2015
Firstpage :
4077
Lastpage :
4080
Abstract :
This paper deals with the results of the breakdown process simulation in strongly overvoltage gaps under high pressures. The presented 0-D model of discharge enables the estimation of characteristic parameters of the initial stage of the breakdown: current rise rate, time of voltage decay across the gap, and current pulse duration of runaway electrons. The discharge model takes into account 0-D growth kinetics of the plasma density in the gap and the impact of the external power supply circuit of the discharge, including the interelectrode capacitance. The model enables estimation of the number and energy range of runaway electrons generated at the initial stage of high-pressure gas breakdown. As an example, computations were conducted for discharge in nitrogen. A comparison of the simulation results with the experimental data enables estimation of the level of the critical field in which we can expect the generation of runaway electrons in the gas discharge.
Keywords :
discharges (electric); nitrogen; plasma density; plasma simulation; 0-D growth kinetics; 0-D model; N2; breakdown process simulation; characteristic parameters; critical field; current pulse duration; current rise rate; discharge model; external power supply circuit; high-pressure gas breakdown; interelectrode capacitance; plasma density; runaway electrons; subnanosecond high-pressure gas discharge; voltage decay time; zero-dimensional theoretical model; Gas discharge devices; Numerical simulation; Plasma devices; Plasma simulation; Gas discharge devices; numerical simulation; plasma devices; plasma simulation; plasma simulation.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2015.2496218
Filename :
7323864
Link To Document :
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