DocumentCode :
3610539
Title :
Porting and Scaling Strategies for Nanoscale CMOS RHBD
Author :
Shuler, Robert L.
Author_Institution :
Nat. Aeronaut. & Space Adm., Houston, TX, USA
Volume :
62
Issue :
12
fYear :
2015
Firstpage :
2856
Lastpage :
2863
Abstract :
Techniques are described for minimizing the number of cells in a digital logic library, scaling and porting the cells to process nodes that do not nominally support scaling, and increasing the separation of critical node pairs without unduly disrupting the design process. A new compact modular 10T compact continuously-voting latch cell reduces circuitry to conventional latch sizes, at less power, allowing modular redundancy to approach theoretical efficiency limits. The result is allows investment in low volume designs, such as but not limited to radiation hardened by design (RHBD) applications for mission critical components, to provide returns over decades-long time periods.
Keywords :
CMOS integrated circuits; nanoelectronics; radiation hardening (electronics); compact modular 10T compact continuously-voting latch cell; modular redundancy; nanoscale CMOS RHBD; radiation hardened by design applications; CMOS integrated circuits; Latches; Layout; Libraries; Logic gates; Nanoscale devices; Redundancy; Aerospace components; CMOS integrated circuits; fault tolerance; redundancy; space technology;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2015.2495779
Filename :
7328773
Link To Document :
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