• DocumentCode
    3610539
  • Title

    Porting and Scaling Strategies for Nanoscale CMOS RHBD

  • Author

    Shuler, Robert L.

  • Author_Institution
    Nat. Aeronaut. & Space Adm., Houston, TX, USA
  • Volume
    62
  • Issue
    12
  • fYear
    2015
  • Firstpage
    2856
  • Lastpage
    2863
  • Abstract
    Techniques are described for minimizing the number of cells in a digital logic library, scaling and porting the cells to process nodes that do not nominally support scaling, and increasing the separation of critical node pairs without unduly disrupting the design process. A new compact modular 10T compact continuously-voting latch cell reduces circuitry to conventional latch sizes, at less power, allowing modular redundancy to approach theoretical efficiency limits. The result is allows investment in low volume designs, such as but not limited to radiation hardened by design (RHBD) applications for mission critical components, to provide returns over decades-long time periods.
  • Keywords
    CMOS integrated circuits; nanoelectronics; radiation hardening (electronics); compact modular 10T compact continuously-voting latch cell; modular redundancy; nanoscale CMOS RHBD; radiation hardened by design applications; CMOS integrated circuits; Latches; Layout; Libraries; Logic gates; Nanoscale devices; Redundancy; Aerospace components; CMOS integrated circuits; fault tolerance; redundancy; space technology;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2015.2495779
  • Filename
    7328773