DocumentCode
3610539
Title
Porting and Scaling Strategies for Nanoscale CMOS RHBD
Author
Shuler, Robert L.
Author_Institution
Nat. Aeronaut. & Space Adm., Houston, TX, USA
Volume
62
Issue
12
fYear
2015
Firstpage
2856
Lastpage
2863
Abstract
Techniques are described for minimizing the number of cells in a digital logic library, scaling and porting the cells to process nodes that do not nominally support scaling, and increasing the separation of critical node pairs without unduly disrupting the design process. A new compact modular 10T compact continuously-voting latch cell reduces circuitry to conventional latch sizes, at less power, allowing modular redundancy to approach theoretical efficiency limits. The result is allows investment in low volume designs, such as but not limited to radiation hardened by design (RHBD) applications for mission critical components, to provide returns over decades-long time periods.
Keywords
CMOS integrated circuits; nanoelectronics; radiation hardening (electronics); compact modular 10T compact continuously-voting latch cell; modular redundancy; nanoscale CMOS RHBD; radiation hardened by design applications; CMOS integrated circuits; Latches; Layout; Libraries; Logic gates; Nanoscale devices; Redundancy; Aerospace components; CMOS integrated circuits; fault tolerance; redundancy; space technology;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2015.2495779
Filename
7328773
Link To Document